Paper Abstract and Keywords |
Presentation |
2009-12-14 13:30
[Poster Presentation]
Measurement and Simulation of Substrate Coupling of CMOS-RF Circuit Naoya Azuma, Makoto Nagata (Kobe Univ.) ICD2009-83 Link to ES Tech. Rep. Archives: ICD2009-83 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Susceptibility of radio frequency (RF) circuits against environmental noises was evaluated by way of direct power injection. Measurements performed on a 90-nm 2.45 GHz CMOS RF driver amplifier show that the injection of RF power into on-die p+ guard bands creates tones at the primary and up-converted frequencies. Simulation achieves the error of less than 2dB against the measured susceptibility of -40dB, with the models of passive impedance networks covering probing tips, die pads, metal wirings, as well as a silicon substrate. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Substrate noise / Substrate coupling / Amplifier / RF / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 109, no. 336, ICD2009-83, pp. 39-42, Dec. 2009. |
Paper # |
ICD2009-83 |
Date of Issue |
2009-12-07 (ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
ICD2009-83 Link to ES Tech. Rep. Archives: ICD2009-83 |
Conference Information |
Committee |
ICD |
Conference Date |
2009-12-14 - 2009-12-15 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Shizuoka University (Hamamatsu) |
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Paper Information |
Registration To |
ICD |
Conference Code |
2009-12-ICD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Measurement and Simulation of Substrate Coupling of CMOS-RF Circuit |
Sub Title (in English) |
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Keyword(1) |
Substrate noise |
Keyword(2) |
Substrate coupling |
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Amplifier |
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RF |
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1st Author's Name |
Naoya Azuma |
1st Author's Affiliation |
Kobe University (Kobe Univ.) |
2nd Author's Name |
Makoto Nagata |
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Kobe University (Kobe Univ.) |
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Speaker |
Author-1 |
Date Time |
2009-12-14 13:30:00 |
Presentation Time |
190 minutes |
Registration for |
ICD |
Paper # |
ICD2009-83 |
Volume (vol) |
vol.109 |
Number (no) |
no.336 |
Page |
pp.39-42 |
#Pages |
4 |
Date of Issue |
2009-12-07 (ICD) |