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| Presentation | 2009-12-11 11:00 Relationship between Facet Stress and Reliability of Edge-Emitting AlGaInAs Laser Diodes Hiroyuki Ichikawa, Akiko Kumagai, Naoya Kono, Shinji Matsukawa, Chie Fukuda, Keiko Iwai, Nobuyuki Ikoma (Sumitomo Electric Industries, Ltd.)  LQE2009-142 Link to ES Tech. Rep. Archives: LQE2009-142 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Although facet stress is one of the important parameters in edge-emitting laser diodes (LDs), the relationship between facet stress and reliability in AlGaInAs edge-emitting LDs has been unclear. Thus, we prepared two types of LDs which difference is stress-direction at the facet. We carried out three types of reliability tests: forward-biased electrostatic discharge (ESD) tests, long-tern reliability tests, and accelerated aging tests. In ESD tests, cumulative degradation ratio of compressive-stress was 33% lower than that of tensile-stress. This effect was obtained by decrease in optical absorption. In long-term aging tests of 85deg 8mW 5000h, degradation did not occur. In accelerated aging tests of 85deg 200mA 800h, degradation occurred only for tensile-stress. This degradation mechanism was different from that due to optical absorption. Although degradation mechanism has been unclear, we found that this degradation is dependent on stress-direction at the facet. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | AlGaInAs / Laser / Stress / Reliability / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 109, no. 331, LQE2009-142, pp. 19-23, Dec. 2009. | |
| Paper # | LQE2009-142 | |
| Date of Issue | 2009-12-04 (LQE) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | LQE2009-142 Link to ES Tech. Rep. Archives: LQE2009-142 |
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| Conference Information | |
| Committee | LQE |
| Conference Date | 2009-12-11 - 2009-12-11 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | LQE |
| Conference Code | 2009-12-LQE |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Relationship between Facet Stress and Reliability of Edge-Emitting AlGaInAs Laser Diodes |
| Sub Title (in English) | |
| Keyword(1) | AlGaInAs |
| Keyword(2) | Laser |
| Keyword(3) | Stress |
| Keyword(4) | Reliability |
| Keyword(5) | |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Hiroyuki Ichikawa |
| 1st Author's Affiliation | Sumitomo Electric Industries, Ltd. (Sumitomo Electric Industries, Ltd.) |
| 2nd Author's Name | Akiko Kumagai |
| 2nd Author's Affiliation | Sumitomo Electric Industries, Ltd. (Sumitomo Electric Industries, Ltd.) |
| 3rd Author's Name | Naoya Kono |
| 3rd Author's Affiliation | Sumitomo Electric Industries, Ltd. (Sumitomo Electric Industries, Ltd.) |
| 4th Author's Name | Shinji Matsukawa |
| 4th Author's Affiliation | Sumitomo Electric Industries, Ltd. (Sumitomo Electric Industries, Ltd.) |
| 5th Author's Name | Chie Fukuda |
| 5th Author's Affiliation | Sumitomo Electric Industries, Ltd. (Sumitomo Electric Industries, Ltd.) |
| 6th Author's Name | Keiko Iwai |
| 6th Author's Affiliation | Sumitomo Electric Industries, Ltd. (Sumitomo Electric Industries, Ltd.) |
| 7th Author's Name | Nobuyuki Ikoma |
| 7th Author's Affiliation | Sumitomo Electric Industries, Ltd. (Sumitomo Electric Industries, Ltd.) |
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| Speaker | Author-1 |
| Date Time | 2009-12-11 11:00:00 |
| Presentation Time | 25 minutes |
| Registration for | LQE |
| Paper # | LQE2009-142 |
| Volume (vol) | vol.109 |
| Number (no) | no.331 |
| Page | pp.19-23 |
| #Pages | 5 |
| Date of Issue | 2009-12-04 (LQE) |
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