Paper Abstract and Keywords |
Presentation |
2009-11-27 15:30
Debug Concern Graph for Supporting Test-Driven Development Masaru Shiozuka, Naoyasu Ubayashi (Kyushu Inst. of Tech) KBSE2009-46 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
This paper proposes Debug Concern Graph (DCG), a knowledge representation method for aiding the debugging process based on Test-Driven Development. Many concerns such as source code revision information, the reason for code modifications, and referred documents are useful to fix a similar bug. However, it is not necessarily easy to reuse these concerns because they are scattered in repositories, source code comments, and memo documents. To deal with this problem, DCG manages these concerns in the form of graphs connecting related debug information. Using DCG, we can easily navigate a lot of debugging know-how. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Test-Driven Development / Debug / Concern Graph / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 109, no. 307, KBSE2009-46, pp. 91-96, Nov. 2009. |
Paper # |
KBSE2009-46 |
Date of Issue |
2009-11-19 (KBSE) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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KBSE2009-46 |
Conference Information |
Committee |
KBSE |
Conference Date |
2009-11-26 - 2009-11-27 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Shimane Univ. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Knowledge Based Software Engineering, etc. |
Paper Information |
Registration To |
KBSE |
Conference Code |
2009-11-KBSE |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Debug Concern Graph for Supporting Test-Driven Development |
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Test-Driven Development |
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Debug |
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Concern Graph |
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1st Author's Name |
Masaru Shiozuka |
1st Author's Affiliation |
Kyushu Institute of Technology (Kyushu Inst. of Tech) |
2nd Author's Name |
Naoyasu Ubayashi |
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Kyushu Institute of Technology (Kyushu Inst. of Tech) |
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Speaker |
Author-1 |
Date Time |
2009-11-27 15:30:00 |
Presentation Time |
35 minutes |
Registration for |
KBSE |
Paper # |
KBSE2009-46 |
Volume (vol) |
vol.109 |
Number (no) |
no.307 |
Page |
pp.91-96 |
#Pages |
6 |
Date of Issue |
2009-11-19 (KBSE) |
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