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Paper Abstract and Keywords
Presentation 2009-11-27 15:30
Debug Concern Graph for Supporting Test-Driven Development
Masaru Shiozuka, Naoyasu Ubayashi (Kyushu Inst. of Tech) KBSE2009-46
Abstract (in Japanese) (See Japanese page) 
(in English) This paper proposes Debug Concern Graph (DCG), a knowledge representation method for aiding the debugging process based on Test-Driven Development. Many concerns such as source code revision information, the reason for code modifications, and referred documents are useful to fix a similar bug. However, it is not necessarily easy to reuse these concerns because they are scattered in repositories, source code comments, and memo documents. To deal with this problem, DCG manages these concerns in the form of graphs connecting related debug information. Using DCG, we can easily navigate a lot of debugging know-how.
Keyword (in Japanese) (See Japanese page) 
(in English) Test-Driven Development / Debug / Concern Graph / / / / /  
Reference Info. IEICE Tech. Rep., vol. 109, no. 307, KBSE2009-46, pp. 91-96, Nov. 2009.
Paper # KBSE2009-46 
Date of Issue 2009-11-19 (KBSE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF KBSE2009-46

Conference Information
Committee KBSE  
Conference Date 2009-11-26 - 2009-11-27 
Place (in Japanese) (See Japanese page) 
Place (in English) Shimane Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Knowledge Based Software Engineering, etc. 
Paper Information
Registration To KBSE 
Conference Code 2009-11-KBSE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Debug Concern Graph for Supporting Test-Driven Development 
Sub Title (in English)  
Keyword(1) Test-Driven Development  
Keyword(2) Debug  
Keyword(3) Concern Graph  
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1st Author's Name Masaru Shiozuka  
1st Author's Affiliation Kyushu Institute of Technology (Kyushu Inst. of Tech)
2nd Author's Name Naoyasu Ubayashi  
2nd Author's Affiliation Kyushu Institute of Technology (Kyushu Inst. of Tech)
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Date Time 2009-11-27 15:30:00 
Presentation Time 35 minutes 
Registration for KBSE 
Paper # KBSE2009-46 
Volume (vol) vol.109 
Number (no) no.307 
Page pp.91-96 
#Pages
Date of Issue 2009-11-19 (KBSE) 


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