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Paper Abstract and Keywords
Presentation 2009-11-20 15:50
Current Fluctuation Measurement for Breaking Contact at Transient Period from Bridge to Arc
Shingo Hanawa, Kazuaki Miyanaga, Yoshiki Kayano, Hiroshi Inoue (Akita Univ.) EMD2009-103 Link to ES Tech. Rep. Archives: EMD2009-103
Abstract (in Japanese) (See Japanese page) 
(in English) Since electromagnetic (EM) noise resulting from an arc discharge disturbs other electric devices, parameters on electromagnetic compatibility, as well as lifetime and reliability, are important properties for electrical contacts. To clarify the characteristics and the mechanism of the generation of the EM noise, the current fluctuation as current noise frequency generated by slowly breaking contacts was investigated experimentally using Ag material. To reveal the characteristics as pure clean surface contact operation, the arc only at the operation of the first contact break was measured. From the time-frequency domain characteristics of current noise, it was clarified that the peaks of current noise due to voltage fluctuation at 30MHz and 70MHz band arise at the arc discharge. It is demonstrated experimentally that peak frequency of current noise is independent of supply voltage. As the supply voltage increases, peak value of current noise increases.
Keyword (in Japanese) (See Japanese page) 
(in English) Arc discharge / Bridge / Current noise (current fluctuation) / Time-frequency domain characteristic / Slow breaking / / /  
Reference Info. IEICE Tech. Rep., vol. 109, no. 287, EMD2009-103, pp. 145-148, Nov. 2009.
Paper # EMD2009-103 
Date of Issue 2009-11-12 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2009-103 Link to ES Tech. Rep. Archives: EMD2009-103

Conference Information
Committee EMD  
Conference Date 2009-11-19 - 2009-11-20 
Place (in Japanese) (See Japanese page) 
Place (in English) Nippon Institute of Technology, Kanda Campus, Tokyo, Japan 
Topics (in Japanese) (See Japanese page) 
Topics (in English) IS-EMD2009 (9th International Session on Electro-Mechanical Devices) 
Paper Information
Registration To EMD 
Conference Code 2009-11-EMD 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Current Fluctuation Measurement for Breaking Contact at Transient Period from Bridge to Arc 
Sub Title (in English)  
Keyword(1) Arc discharge  
Keyword(2) Bridge  
Keyword(3) Current noise (current fluctuation)  
Keyword(4) Time-frequency domain characteristic  
Keyword(5) Slow breaking  
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1st Author's Name Shingo Hanawa  
1st Author's Affiliation Akita University (Akita Univ.)
2nd Author's Name Kazuaki Miyanaga  
2nd Author's Affiliation Akita University (Akita Univ.)
3rd Author's Name Yoshiki Kayano  
3rd Author's Affiliation Akita University (Akita Univ.)
4th Author's Name Hiroshi Inoue  
4th Author's Affiliation Akita University (Akita Univ.)
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Speaker Author-1 
Date Time 2009-11-20 15:50:00 
Presentation Time 20 minutes 
Registration for EMD 
Paper # EMD2009-103 
Volume (vol) vol.109 
Number (no) no.287 
Page pp.145-148 
#Pages
Date of Issue 2009-11-12 (EMD) 


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