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Paper Abstract and Keywords
Presentation 2009-11-20 09:30
AlN growth on period trench patterned AlN/sapphire by Low-pressure HVPE
Kohei Fujita, Kazuteru Okuura, Hideto Miyake, Kazumasa Hiramatsu (Mie Univ.), Jyun Norimatsu, Hideki Hirayama (Riken) ED2009-147 CPM2009-121 LQE2009-126 Link to ES Tech. Rep. Archives: ED2009-147 CPM2009-121 LQE2009-126
Abstract (in Japanese) (See Japanese page) 
(in English) High-quality AlN thick film were grown on trench-patterned AlN template by Low-pressure HVPE. Compared with the normal template, the patterned template was founded to improve crystalline quality of AlN layer. In this study, the effect of the pattern periodicity was investigated. Results showed that the width of groove mainly influence the position depth of voids forming in AlN. A larger crack-free thickness of AlN layer (~30μm) was obtained when using a patterned AlN template with a wider groove. It is partly attributed to the higher forming position of voids.
Keyword (in Japanese) (See Japanese page) 
(in English) HVPE / AlN / trench-patterned / void / thick film / / /  
Reference Info. IEICE Tech. Rep., vol. 109, no. 288, ED2009-147, pp. 91-94, Nov. 2009.
Paper # ED2009-147 
Date of Issue 2009-11-12 (ED, CPM, LQE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ED2009-147 CPM2009-121 LQE2009-126 Link to ES Tech. Rep. Archives: ED2009-147 CPM2009-121 LQE2009-126

Conference Information
Committee ED LQE CPM  
Conference Date 2009-11-19 - 2009-11-20 
Place (in Japanese) (See Japanese page) 
Place (in English) Univ. of Tokushima (Josanjima Campus, Kogyo-Kaikan) 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ED 
Conference Code 2009-11-ED-LQE-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) AlN growth on period trench patterned AlN/sapphire by Low-pressure HVPE 
Sub Title (in English)  
Keyword(1) HVPE  
Keyword(2) AlN  
Keyword(3) trench-patterned  
Keyword(4) void  
Keyword(5) thick film  
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1st Author's Name Kohei Fujita  
1st Author's Affiliation Mie University (Mie Univ.)
2nd Author's Name Kazuteru Okuura  
2nd Author's Affiliation Mie University (Mie Univ.)
3rd Author's Name Hideto Miyake  
3rd Author's Affiliation Mie University (Mie Univ.)
4th Author's Name Kazumasa Hiramatsu  
4th Author's Affiliation Mie University (Mie Univ.)
5th Author's Name Jyun Norimatsu  
5th Author's Affiliation Riken (Riken)
6th Author's Name Hideki Hirayama  
6th Author's Affiliation Riken (Riken)
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Speaker Author-1 
Date Time 2009-11-20 09:30:00 
Presentation Time 25 minutes 
Registration for ED 
Paper # ED2009-147, CPM2009-121, LQE2009-126 
Volume (vol) vol.109 
Number (no) no.288(ED), no.289(CPM), no.290(LQE) 
Page pp.91-94 
#Pages
Date of Issue 2009-11-12 (ED, CPM, LQE) 


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