Paper Abstract and Keywords |
Presentation |
2009-10-01 09:10
Feasibility Study on EMI Measurement "furoshiki" using 2V Organic CMOS and Silicon CMOS Koichi Ishida, Naoki Masunaga, Zhiwei Zhou, Tadashi Yasufuku, Tsuyoshi Sekitani (Univ. of Tokyo), Ute Zschieschang, Hagen Klauk (Max Planck Institute), Makoto Takamiya, Takao Someya, Takayasu Sakurai (Univ. of Tokyo) ICD2009-33 Link to ES Tech. Rep. Archives: ICD2009-33 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
(Not available yet) |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
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Reference Info. |
IEICE Tech. Rep., vol. 109, no. 214, ICD2009-33, pp. 1-6, Oct. 2009. |
Paper # |
ICD2009-33 |
Date of Issue |
2009-09-24 (ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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ICD2009-33 Link to ES Tech. Rep. Archives: ICD2009-33 |
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