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Paper Abstract and Keywords
Presentation 2009-09-04 14:50
Experimental Study of Radiated Electromagnetic Field Intensity due to Micro Gap Discharge
Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi (Tohoku Gakuin Univ.), Osamu Fujiwara (Nagoya Inst. of Tech.) AP2009-100
Abstract (in Japanese) (See Japanese page) 
(in English) The breakdown field strength and radiated electromagnetic field intensity due to micro gap discharge were examined in experimental study. As a consequence, the radiated electromagnetic field intensity has inverse proportion to discharge voltage below about 800V breakdown. And so, the relationship between radiated electromagnetic field intensity and discharge voltage has indefinite dispersion in the wide gap discharge of about over 0.04mm gap length. It was confirmed that one of cause of the dispersion is an effect of surface condition in the discharge electrode.
Keyword (in Japanese) (See Japanese page) 
(in English) Breakdown field strength / Radiated electromagnetic field intensity / ESD / Micro gap discharge / / / /  
Reference Info. IEICE Tech. Rep., vol. 109, no. 183, AP2009-100, pp. 121-124, Sept. 2009.
Paper # AP2009-100 
Date of Issue 2009-08-27 (AP) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Download PDF AP2009-100

Conference Information
Committee AP  
Conference Date 2009-09-03 - 2009-09-04 
Place (in Japanese) (See Japanese page) 
Place (in English) Hachinohe Inst. of Tech. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) AP 
Paper Information
Registration To AP 
Conference Code 2009-09-AP 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Experimental Study of Radiated Electromagnetic Field Intensity due to Micro Gap Discharge 
Sub Title (in English)  
Keyword(1) Breakdown field strength  
Keyword(2) Radiated electromagnetic field intensity  
Keyword(3) ESD  
Keyword(4) Micro gap discharge  
1st Author's Name Ken Kawamata  
1st Author's Affiliation Hachinohe Institute of Technology (Hachinohe Inst. of Tech.)
2nd Author's Name Shigeki Minegishi  
2nd Author's Affiliation Tohoku Gakuin University (Tohoku Gakuin Univ.)
3rd Author's Name Osamu Fujiwara  
3rd Author's Affiliation Nagoya Institute of Technology (Nagoya Inst. of Tech.)
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Date Time 2009-09-04 14:50:00 
Presentation Time 25 
Registration for AP 
Paper # IEICE-AP2009-100 
Volume (vol) IEICE-109 
Number (no) no.183 
Page pp.121-124 
#Pages IEICE-4 
Date of Issue IEICE-AP-2009-08-27 

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