Paper Abstract and Keywords |
Presentation |
2009-08-21 16:40
Equivalent Circuit Analysis of Ag Breaking Contact Phenomena Kenji Sato, Noboru Wakatsuki, Nobuo Takatsu (Ishinomaki Senshu Univ.) EMD2009-57 CPM2009-81 OPE2009-105 LQE2009-64 Link to ES Tech. Rep. Archives: EMD2009-57 CPM2009-81 OPE2009-105 LQE2009-64 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
The application of an electric equivalent circuit is examined for the transition process of physical phenomena from energizing contact to melting contact and to arc discharge during the breaking contact operation. Due to the tangency on the surface with the ruggedness, the contact is considered to consist of a lot of contacting points. The electric functions of contacting points are classified into a electric conductive (resistance) cluster, a melting cluster, and a electric field effect cluster. The electric conductive cluster would transfer to the melting cluster at Vc=Um (Vc; contact voltage, Um; melting voltage) . The melting cluster would melt down or would fabricate the metal bridge, depending on the electric circuit condition. The field effect cluster showed the possibility that the field emission and/or the dielectric breakdown of the electron would occur before and after the fusion of the melting cluster. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Electric contacts / Electromagnetic Relay / Metal Bridge / Ag Contacts / Equivalent Circuit / / / |
Reference Info. |
IEICE Tech. Rep., vol. 109, no. 173, EMD2009-57, pp. 163-168, Aug. 2009. |
Paper # |
EMD2009-57 |
Date of Issue |
2009-08-13 (EMD, CPM, OPE, LQE) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
EMD2009-57 CPM2009-81 OPE2009-105 LQE2009-64 Link to ES Tech. Rep. Archives: EMD2009-57 CPM2009-81 OPE2009-105 LQE2009-64 |
Conference Information |
Committee |
OPE EMD CPM LQE |
Conference Date |
2009-08-20 - 2009-08-21 |
Place (in Japanese) |
(See Japanese page) |
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Paper Information |
Registration To |
EMD |
Conference Code |
2009-08-OPE-EMD-CPM-LQE |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Equivalent Circuit Analysis of Ag Breaking Contact Phenomena |
Sub Title (in English) |
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Keyword(1) |
Electric contacts |
Keyword(2) |
Electromagnetic Relay |
Keyword(3) |
Metal Bridge |
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Ag Contacts |
Keyword(5) |
Equivalent Circuit |
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1st Author's Name |
Kenji Sato |
1st Author's Affiliation |
Ishinomaki Senshu University (Ishinomaki Senshu Univ.) |
2nd Author's Name |
Noboru Wakatsuki |
2nd Author's Affiliation |
Ishinomaki Senshu University (Ishinomaki Senshu Univ.) |
3rd Author's Name |
Nobuo Takatsu |
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Ishinomaki Senshu University (Ishinomaki Senshu Univ.) |
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Speaker |
Author-1 |
Date Time |
2009-08-21 16:40:00 |
Presentation Time |
25 minutes |
Registration for |
EMD |
Paper # |
EMD2009-57, CPM2009-81, OPE2009-105, LQE2009-64 |
Volume (vol) |
vol.109 |
Number (no) |
no.173(EMD), no.174(CPM), no.175(OPE), no.176(LQE) |
Page |
pp.163-168 |
#Pages |
6 |
Date of Issue |
2009-08-13 (EMD, CPM, OPE, LQE) |
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