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| Presentation | 2009-06-24 16:15 Current Controlled MOS Current Mode Logic with Auto-detection of Threshold Voltage Fluctuation Tetsuo Endoh, Hyoungjun Na (Tohoku Univ.)  ED2009-55 SDM2009-50 Link to ES Tech. Rep. Archives: ED2009-55 SDM2009-50 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | A Current Controlled (CC-) MOS Current Mode Logic (MCML) circuit based on auto-detection of threshold voltage (Vth) fluctuation is proposed. This proposed circuit suppresses the degradation of circuit performance induced by the Vth fluctuations of the transistors automatically, by detecting the Vth fluctuations of the transistor. When the Vth fluctuation over $\pm 0.1$V occurs on the pair transistors of the circuit, the minimum value of the dc gain is increased by about 111 times by using the proposed circuit. Furthermore, it is shown that the maximum operating frequency of the circuit is increased from 0 GHz to 24.8 GHz when the Vth fluctuation of $\pm 0.1$V occurs in the transistors of the circuit, by using the proposed new circuit technology. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | MCML / Vth / Threshold Voltage Fluctuation / MOSFET / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 109, no. 98, SDM2009-50, pp. 21-24, June 2009. | |
| Paper # | SDM2009-50 | |
| Date of Issue | 2009-06-17 (ED, SDM) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | ED2009-55 SDM2009-50 Link to ES Tech. Rep. Archives: ED2009-55 SDM2009-50 |
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| Conference Information | |
| Committee | SDM ED |
| Conference Date | 2009-06-24 - 2009-06-26 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Haeundae Grand Hotel, Busan, Korea |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | 2009 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices |
| Paper Information | |
| Registration To | SDM |
| Conference Code | 2009-06-SDM-ED |
| Language | English |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Current Controlled MOS Current Mode Logic with Auto-detection of Threshold Voltage Fluctuation |
| Sub Title (in English) | |
| Keyword(1) | MCML |
| Keyword(2) | Vth |
| Keyword(3) | Threshold Voltage Fluctuation |
| Keyword(4) | MOSFET |
| Keyword(5) | |
| Keyword(6) | |
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| Keyword(8) | |
| 1st Author's Name | Tetsuo Endoh |
| 1st Author's Affiliation | Tohoku University (Tohoku Univ.) |
| 2nd Author's Name | Hyoungjun Na |
| 2nd Author's Affiliation | Tohoku University (Tohoku Univ.) |
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| Speaker | Author-1 |
| Date Time | 2009-06-24 16:15:00 |
| Presentation Time | 15 minutes |
| Registration for | SDM |
| Paper # | ED2009-55, SDM2009-50 |
| Volume (vol) | vol.109 |
| Number (no) | no.97(ED), no.98(SDM) |
| Page | pp.21-24 |
| #Pages | 4 |
| Date of Issue | 2009-06-17 (ED, SDM) |
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