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| Presentation | 2009-04-24 13:05 Effect of Frequency Step on Uncertainty of Measurement by Site VSWR Method Tetsushi Watanabe (Ind Tech. Center of Okayama Prefecture), Yoshitaka Toyota, Kengo Iokibe, Ryuji Koga (Okayama Univ.)  EMCJ2009-1 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | EMI measurement over 1GHz must be operated in a free-space, open area test site. The validation method of free-space condition is called "Site Voltage Standing-wave Ratio" method, which is standardized by CISPR 16-1-4. The standard defines a new procedure for validation of EMC test sites by the ratio of maximum and minimum of transmitted voltages measured at the only 6 locations within a range of 400 mm length. The small number of measurement points can cause larger uncertainty. Although the standard requires the measurement at a frequency interval of 50MHz or less, the measurement is usually performed at the largest frequency interval of 50 MHz. In this paper, we propose a new approach to reduce the measurement uncertainty with a narrower frequency interval. The approach was validated by measurement as well as simulation. Also the approach was found to reduce the uncertainty caused by the location error in the measurement setup. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | EMI measurement / Site VSWR method / Free-space / Test site / Frequency interval / Over 1GHz / / | |
| Reference Info. | IEICE Tech. Rep., vol. 109, no. 18, EMCJ2009-1, pp. 1-6, April 2009. | |
| Paper # | EMCJ2009-1 | |
| Date of Issue | 2009-04-17 (EMCJ) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EMCJ2009-1 |
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| Conference Information | |
| Committee | EMCJ |
| Conference Date | 2009-04-24 - 2009-04-24 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | EMCJ |
| Conference Code | 2009-04-EMCJ |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Effect of Frequency Step on Uncertainty of Measurement by Site VSWR Method |
| Sub Title (in English) | |
| Keyword(1) | EMI measurement |
| Keyword(2) | Site VSWR method |
| Keyword(3) | Free-space |
| Keyword(4) | Test site |
| Keyword(5) | Frequency interval |
| Keyword(6) | Over 1GHz |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Tetsushi Watanabe |
| 1st Author's Affiliation | Industrial Technology Center of Okayama Prefecture (Ind Tech. Center of Okayama Prefecture) |
| 2nd Author's Name | Yoshitaka Toyota |
| 2nd Author's Affiliation | Okayama University (Okayama Univ.) |
| 3rd Author's Name | Kengo Iokibe |
| 3rd Author's Affiliation | Okayama University (Okayama Univ.) |
| 4th Author's Name | Ryuji Koga |
| 4th Author's Affiliation | Okayama University (Okayama Univ.) |
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| Speaker | Author-1 |
| Date Time | 2009-04-24 13:05:00 |
| Presentation Time | 25 minutes |
| Registration for | EMCJ |
| Paper # | EMCJ2009-1 |
| Volume (vol) | vol.109 |
| Number (no) | no.18 |
| Page | pp.1-6 |
| #Pages | 6 |
| Date of Issue | 2009-04-17 (EMCJ) |
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