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Paper Abstract and Keywords
Presentation 2009-04-14 11:05
A 7T/14T Dependable SRAM and Its Array Structure to Avoid Half Selection
Shunsuke Okumura, Hidehiro Fujiwara, Yusuke Iguchi, Hiroki Noguchi, Hiroshi Kawaguchi (Kobe Univ.), Masahiko Yoshimoto (Kobe Univ./JST-CREST) ICD2009-7 Link to ES Tech. Rep. Archives: ICD2009-7
Abstract (in Japanese) (See Japanese page) 
(in English) We propose a novel dependable SRAM with 7T cells and their array structure that avoids a half-selection problem. The dependable SRAM has normal mode and dependable mode, and dynamically scales its reliability two memory cells for one-bit information (i.e. 14T/bit). The test chip fabricated in a 65-nm process technology demonstrated that the minimum voltages of conventional 6T memory cell and 7T normal mode are improved by 0.24V and 0.18V, respectively. We realized 7T/14T dependable SRAM which can dynamically change its reliability.
Keyword (in Japanese) (See Japanese page) 
(in English) SRAM / Dependability / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 109, no. 2, ICD2009-7, pp. 33-38, April 2009.
Paper # ICD2009-7 
Date of Issue 2009-04-06 (ICD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ICD2009-7 Link to ES Tech. Rep. Archives: ICD2009-7

Conference Information
Committee ICD  
Conference Date 2009-04-13 - 2009-04-14 
Place (in Japanese) (See Japanese page) 
Place (in English) Daikanso (Matsushima, Miyagi) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Semiconductor Memory Technologies 
Paper Information
Registration To ICD 
Conference Code 2009-04-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A 7T/14T Dependable SRAM and Its Array Structure to Avoid Half Selection 
Sub Title (in English)  
Keyword(1) SRAM  
Keyword(2) Dependability  
1st Author's Name Shunsuke Okumura  
1st Author's Affiliation Kobe University (Kobe Univ.)
2nd Author's Name Hidehiro Fujiwara  
2nd Author's Affiliation Kobe University (Kobe Univ.)
3rd Author's Name Yusuke Iguchi  
3rd Author's Affiliation Kobe University (Kobe Univ.)
4th Author's Name Hiroki Noguchi  
4th Author's Affiliation Kobe University (Kobe Univ.)
5th Author's Name Hiroshi Kawaguchi  
5th Author's Affiliation Kobe University (Kobe Univ.)
6th Author's Name Masahiko Yoshimoto  
6th Author's Affiliation Kobe University/JST-CREST (Kobe Univ./JST-CREST)
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Date Time 2009-04-14 11:05:00 
Presentation Time 25 
Registration for ICD 
Paper # IEICE-ICD2009-7 
Volume (vol) IEICE-109 
Number (no) no.2 
Page pp.33-38 
#Pages IEICE-6 
Date of Issue IEICE-ICD-2009-04-06 

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