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Paper Abstract and Keywords
Presentation 2009-03-13 11:05
Correlation Verification between Transistor Variability Model with Body Biasing and Ring Oscillation Frequency in Subthreshold Circuits
Hiroshi Fuketa, Masanori Hashimoto, Yukio Mitsuyama, Takao Onoye (Osaka Univ./JST-CREST) VLD2008-160
Abstract (in Japanese) (See Japanese page) 
(in English) This paper presents modeling of manufacturing variability and
body bias effect for subthreshold circuits
based on measurement of a device array circuit in a 90nm technology.
The device array consists of P/NMOS transistors and ring oscillators.
This work verifies the correlation between the variation model extracted from
I-V measurement results and oscillation frequencies, which means
the transistor-level variation model is examined and confirmed in terms of circuit performance.
We demonstrate that delay variations of subthreshold circuits are
well characterized with two parameters - threshold voltage and
subthreshold swing parameter.
We also reveal that threshold voltage shift by body biasing can be
modeled deterministically.
Keyword (in Japanese) (See Japanese page) 
(in English) subthreshold circuit / manufacturing variability / measurement / variability modeling / body biasing / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 478, VLD2008-160, pp. 201-206, March 2009.
Paper # VLD2008-160 
Date of Issue 2009-03-04 (VLD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2008-160

Conference Information
Committee VLD  
Conference Date 2009-03-11 - 2009-03-13 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Technology for a System-on-Silicon 
Paper Information
Registration To VLD 
Conference Code 2009-03-VLD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Correlation Verification between Transistor Variability Model with Body Biasing and Ring Oscillation Frequency in Subthreshold Circuits 
Sub Title (in English)  
Keyword(1) subthreshold circuit  
Keyword(2) manufacturing variability  
Keyword(3) measurement  
Keyword(4) variability modeling  
Keyword(5) body biasing  
1st Author's Name Hiroshi Fuketa  
1st Author's Affiliation Osaka University/JST-CREST (Osaka Univ./JST-CREST)
2nd Author's Name Masanori Hashimoto  
2nd Author's Affiliation Osaka University/JST-CREST (Osaka Univ./JST-CREST)
3rd Author's Name Yukio Mitsuyama  
3rd Author's Affiliation Osaka University/JST-CREST (Osaka Univ./JST-CREST)
4th Author's Name Takao Onoye  
4th Author's Affiliation Osaka University/JST-CREST (Osaka Univ./JST-CREST)
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Date Time 2009-03-13 11:05:00 
Presentation Time 25 
Registration for VLD 
Paper # IEICE-VLD2008-160 
Volume (vol) IEICE-108 
Number (no) no.478 
Page pp.201-206 
#Pages IEICE-6 
Date of Issue IEICE-VLD-2009-03-04 

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