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Paper Abstract and Keywords
Presentation 2009-03-11 10:55
Random Testing for Arithmetic Optimization of C compilers
Hironobu Awazu, Nagisa Ishiura (Kwansei Gakuin Univ.) VLD2008-127
Abstract (in Japanese) (See Japanese page) 
(in English) This article presents random testing of C compilers focusing on arithmetic optimization. It tests if code generation and optimization are properly performed for integer arithmetic expressions containing various integer type variables and implicit casting. The types and the initial values of the variables are randomly selected and the arithmetic expressions are randomly composed to form a test program. The expected values of the expressions are precomputed by the random test program generator so that the comparison between the computed values and the
expected values is done within the test program. During the preparation of the expected values, all the intermediate values are tested so that the generator do not produce programs that results in undefined behavior by zero division, overflow, nor left-shift of negative values, etc. An implemented random test system successfully detected a bug in GCC 4.1.2 for x86.
Keyword (in Japanese) (See Japanese page) 
(in English) C compilers / random test / optimization / arithmetic expressions / / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 478, VLD2008-127, pp. 7-10, March 2009.
Paper # VLD2008-127 
Date of Issue 2009-03-04 (VLD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2008-127

Conference Information
Committee VLD  
Conference Date 2009-03-11 - 2009-03-13 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Technology for a System-on-Silicon 
Paper Information
Registration To VLD 
Conference Code 2009-03-VLD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Random Testing for Arithmetic Optimization of C compilers 
Sub Title (in English)  
Keyword(1) C compilers  
Keyword(2) random test  
Keyword(3) optimization  
Keyword(4) arithmetic expressions  
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1st Author's Name Hironobu Awazu  
1st Author's Affiliation Kwansei Gakuin University (Kwansei Gakuin Univ.)
2nd Author's Name Nagisa Ishiura  
2nd Author's Affiliation Kwansei Gakuin (Kwansei Gakuin Univ.)
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Speaker
Date Time 2009-03-11 10:55:00 
Presentation Time 25 
Registration for VLD 
Paper # IEICE-VLD2008-127 
Volume (vol) IEICE-108 
Number (no) no.478 
Page pp.7-10 
#Pages IEICE-4 
Date of Issue IEICE-VLD-2009-03-04 


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