IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2009-03-02 14:00
Improving Pairwise Testing Using the Properties of the System under Test
Kentaro Hideshima, Tatsuhiro Tsuchiya, Tohru Kikuno (Osaka Univ.) SS2008-48
Abstract (in Japanese) (See Japanese page) 
(in English) A testing process takes a large part of the whole software development process, and thus testing methods are required that can effectively detect many faults with a small number of tests. Pairwise testing is known as such a testing method. Pairwise testing requires that all the combinations of parameter values for every pair of parameters be tested. In this paper we propose to use the properties of the system under test to improve pairwise testing. Specifically we allow the tester to specify mutually unrelated parameters and parameters that should be proactively tested. Our algorithm makes use of these inputs in generating test cases. We empirically show that using thus generated tests a higher code coverage can be achieved with fewer tests.
Keyword (in Japanese) (See Japanese page) 
(in English) Software Testing / Combinatorial Testing / Pairwise Testing / / / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 444, SS2008-48, pp. 1-6, March 2009.
Paper # SS2008-48 
Date of Issue 2009-02-23 (SS) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SS2008-48

Conference Information
Committee SS  
Conference Date 2009-03-02 - 2009-03-03 
Place (in Japanese) (See Japanese page) 
Place (in English) Saga University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) general 
Paper Information
Registration To SS 
Conference Code 2009-03-SS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Improving Pairwise Testing Using the Properties of the System under Test 
Sub Title (in English)  
Keyword(1) Software Testing  
Keyword(2) Combinatorial Testing  
Keyword(3) Pairwise Testing  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Kentaro Hideshima  
1st Author's Affiliation Osaka University (Osaka Univ.)
2nd Author's Name Tatsuhiro Tsuchiya  
2nd Author's Affiliation Osaka University (Osaka Univ.)
3rd Author's Name Tohru Kikuno  
3rd Author's Affiliation Osaka University (Osaka Univ.)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2009-03-02 14:00:00 
Presentation Time 30 minutes 
Registration for SS 
Paper # SS2008-48 
Volume (vol) vol.108 
Number (no) no.444 
Page pp.1-6 
#Pages
Date of Issue 2009-02-23 (SS) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan