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Paper Abstract and Keywords
Presentation 2009-02-26 15:40
Feild Emitter Arrays with focusing function and it's applications
Yoichiro Neo, Masafumi Takeda, Tomoya Tagami, Syun Horie, Toru Aoki, Hidenori Mimura (Shizuoka Univ.), Tomoya Yoshida, Masayoshi Nagao, Seigo Kanemaru (National Inst.of Adv Ind Scie and Tech.) ED2008-228 SDM2008-220 Link to ES Tech. Rep. Archives: ED2008-228 SDM2008-220
Abstract (in Japanese) (See Japanese page) 
(in English) We have developed field emission array (FEA) with new focusing electrode structure and proposed several devices and applications using FEA. In order to realize a fine defined field emission display (FED), optimized volcano- structured double-gated FEA was fabricated and focusing characteristics was successfully confirmed. By using volcano-structured double-gated FEA, high frequency vacuum tubes, X-ray imaging tube and excimer lamp were newly proposed and estimated. Further more, highly performed focusing characteristics is needed for the applications using crossover electron beam, such as electron beam microscope and electron beam lithography. The Quad-gated FEA, which equipped an einzel lens just in front of extractor electrode, was fabricated and estimated. It was shown by simulations that the emitted electron beam made a crossover. These results promised new devices and application using FEA.
Keyword (in Japanese) (See Japanese page) 
(in English) field emission array / field emission display / einzel lens / electron beam microscope / electron beam lithography / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 438, SDM2008-220, pp. 23-27, Feb. 2009.
Paper # SDM2008-220 
Date of Issue 2009-02-19 (ED, SDM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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Download PDF ED2008-228 SDM2008-220 Link to ES Tech. Rep. Archives: ED2008-228 SDM2008-220

Conference Information
Committee SDM ED  
Conference Date 2009-02-26 - 2009-02-27 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Functional nanodevices and related technologies 
Paper Information
Registration To SDM 
Conference Code 2009-02-SDM-ED 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Feild Emitter Arrays with focusing function and it's applications 
Sub Title (in English)  
Keyword(1) field emission array  
Keyword(2) field emission display  
Keyword(3) einzel lens  
Keyword(4) electron beam microscope  
Keyword(5) electron beam lithography  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yoichiro Neo  
1st Author's Affiliation Shizuoka University (Shizuoka Univ.)
2nd Author's Name Masafumi Takeda  
2nd Author's Affiliation Shizuoka University (Shizuoka Univ.)
3rd Author's Name Tomoya Tagami  
3rd Author's Affiliation Shizuoka University (Shizuoka Univ.)
4th Author's Name Syun Horie  
4th Author's Affiliation Shizuoka University (Shizuoka Univ.)
5th Author's Name Toru Aoki  
5th Author's Affiliation Shizuoka University (Shizuoka Univ.)
6th Author's Name Hidenori Mimura  
6th Author's Affiliation Shizuoka University (Shizuoka Univ.)
7th Author's Name Tomoya Yoshida  
7th Author's Affiliation National Institute of Advanced Industrial Science and Technology (National Inst.of Adv Ind Scie and Tech.)
8th Author's Name Masayoshi Nagao  
8th Author's Affiliation National Institute of Advanced Industrial Science and Technology (National Inst.of Adv Ind Scie and Tech.)
9th Author's Name Seigo Kanemaru  
9th Author's Affiliation National Institute of Advanced Industrial Science and Technology (National Inst.of Adv Ind Scie and Tech.)
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Speaker Author-1 
Date Time 2009-02-26 15:40:00 
Presentation Time 25 minutes 
Registration for SDM 
Paper # ED2008-228, SDM2008-220 
Volume (vol) vol.108 
Number (no) no.437(ED), no.438(SDM) 
Page pp.23-27 
#Pages
Date of Issue 2009-02-19 (ED, SDM) 


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