IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2009-02-20 16:45
Reliability test results for SC and MU connectors installed on outside plant
Yoshiteru Abe, Shuichi Yanagi, Shuichiro Asakawa, Ryo Nagase (NTT) R2008-57 EMD2008-133 Link to ES Tech. Rep. Archives: EMD2008-133
Abstract (in Japanese) (See Japanese page) 
(in English) Optical connector is an essential component of optical network systems. In fiber to the home (FTTH) systems, the optical connectors are used in both indoor environments such as buildings and in outdoor equipments such as aerial closures. To confirm the durability of optical connectors employing PC connection in actual outdoor environments, since 1997 we have been performing a reliability test on SC and MU connectors installed in a high temperature and high humidity location. We measured the ferrule end dimensions and optical performance of the SC and MU connectors. We confirmed that the SC and MU connectors employing the PC connection have the good durability in an actual outdoor environment.
Keyword (in Japanese) (See Japanese page) 
(in English) Optical connector / SC connector / MU connector / Reliability / / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 434, EMD2008-133, pp. 77-81, Feb. 2009.
Paper # EMD2008-133 
Date of Issue 2009-02-13 (R, EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2008-57 EMD2008-133 Link to ES Tech. Rep. Archives: EMD2008-133

Conference Information
Committee EMD R  
Conference Date 2009-02-20 - 2009-02-20 
Place (in Japanese) (See Japanese page) 
Place (in English) Sumitomo Wiring Systems LTD., Head Office 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2009-02-EMD-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Reliability test results for SC and MU connectors installed on outside plant 
Sub Title (in English)  
Keyword(1) Optical connector  
Keyword(2) SC connector  
Keyword(3) MU connector  
Keyword(4) Reliability  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yoshiteru Abe  
1st Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
2nd Author's Name Shuichi Yanagi  
2nd Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
3rd Author's Name Shuichiro Asakawa  
3rd Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
4th Author's Name Ryo Nagase  
4th Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2009-02-20 16:45:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # R2008-57, EMD2008-133 
Volume (vol) vol.108 
Number (no) no.433(R), no.434(EMD) 
Page pp.77-81 
#Pages
Date of Issue 2009-02-13 (R, EMD) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan