Paper Abstract and Keywords |
Presentation |
2009-02-20 16:45
Reliability test results for SC and MU connectors installed on outside plant Yoshiteru Abe, Shuichi Yanagi, Shuichiro Asakawa, Ryo Nagase (NTT) R2008-57 EMD2008-133 Link to ES Tech. Rep. Archives: EMD2008-133 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Optical connector is an essential component of optical network systems. In fiber to the home (FTTH) systems, the optical connectors are used in both indoor environments such as buildings and in outdoor equipments such as aerial closures. To confirm the durability of optical connectors employing PC connection in actual outdoor environments, since 1997 we have been performing a reliability test on SC and MU connectors installed in a high temperature and high humidity location. We measured the ferrule end dimensions and optical performance of the SC and MU connectors. We confirmed that the SC and MU connectors employing the PC connection have the good durability in an actual outdoor environment. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Optical connector / SC connector / MU connector / Reliability / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 108, no. 434, EMD2008-133, pp. 77-81, Feb. 2009. |
Paper # |
EMD2008-133 |
Date of Issue |
2009-02-13 (R, EMD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
R2008-57 EMD2008-133 Link to ES Tech. Rep. Archives: EMD2008-133 |
Conference Information |
Committee |
EMD R |
Conference Date |
2009-02-20 - 2009-02-20 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Sumitomo Wiring Systems LTD., Head Office |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
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Paper Information |
Registration To |
EMD |
Conference Code |
2009-02-EMD-R |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Reliability test results for SC and MU connectors installed on outside plant |
Sub Title (in English) |
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Keyword(1) |
Optical connector |
Keyword(2) |
SC connector |
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MU connector |
Keyword(4) |
Reliability |
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1st Author's Name |
Yoshiteru Abe |
1st Author's Affiliation |
Nippon Telegraph and Telephone Corporation (NTT) |
2nd Author's Name |
Shuichi Yanagi |
2nd Author's Affiliation |
Nippon Telegraph and Telephone Corporation (NTT) |
3rd Author's Name |
Shuichiro Asakawa |
3rd Author's Affiliation |
Nippon Telegraph and Telephone Corporation (NTT) |
4th Author's Name |
Ryo Nagase |
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Nippon Telegraph and Telephone Corporation (NTT) |
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Speaker |
Author-1 |
Date Time |
2009-02-20 16:45:00 |
Presentation Time |
25 minutes |
Registration for |
EMD |
Paper # |
R2008-57, EMD2008-133 |
Volume (vol) |
vol.108 |
Number (no) |
no.433(R), no.434(EMD) |
Page |
pp.77-81 |
#Pages |
5 |
Date of Issue |
2009-02-13 (R, EMD) |
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