IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2009-02-20 13:20
Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- for Contact Resistance (IV) --
Shin-ichi Wada, Taketo Sonoda, Keiji Koshida, Mitsuo Kikuchi, Hiroaki Kubota (TMC System), Koichiro Sawa (Keio Univ.) R2008-50 EMD2008-126 Link to ES Tech. Rep. Archives: EMD2008-126
Abstract (in Japanese) (See Japanese page) 
(in English) The authors have developed the hammering oscillating mechanism which could give real vibration to electrical contacts and made experiments with total operation’s number, about 42 millions. After the term was passed, the contact resistance increased to about 200Ω. The tendency continued till the end. By using the connectors with smaller contact’s force they made experiments with total operation’s number, about 44millions. After the term was passed, the contact resistance increased to about 600-1000Ω. On the contrary, by using the sliding contact mechanism they made experiments with total operation’s number, about 24 millions. After the term was passed, the contact resistance increased to about 200Ω. And inputs of hammering oscillating mechanism’s data were applied to 3-D oscillating mechanism, which generated quasi-damping oscillation and they made experiments with total operation’s number, about 6 millions. Although the three mechanisms are completely different (in principles, methods, numbers, and so on ), the results of three measurements were similar on the oscillating phenomenon. It was suggested that the three mechanisms could detect the more real degradation phenomenon on contacts with the influences of micro-vibration by applying the model of fretting corrosion to the fluctuation of contact resistance.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / contact resistance / sliding mechanism / hammering oscillating mechanism / 3-D oscillating mechanism / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 434, EMD2008-126, pp. 37-42, Feb. 2009.
Paper # EMD2008-126 
Date of Issue 2009-02-13 (R, EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2008-50 EMD2008-126 Link to ES Tech. Rep. Archives: EMD2008-126

Conference Information
Committee EMD R  
Conference Date 2009-02-20 - 2009-02-20 
Place (in Japanese) (See Japanese page) 
Place (in English) Sumitomo Wiring Systems LTD., Head Office 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2009-02-EMD-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation phenomenon of electrical contacts by hammering oscillating mechanism 
Sub Title (in English) for Contact Resistance (IV) 
Keyword(1) electrical contact  
Keyword(2) contact resistance  
Keyword(3) sliding mechanism  
Keyword(4) hammering oscillating mechanism  
Keyword(5) 3-D oscillating mechanism  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System (TMC System)
2nd Author's Name Taketo Sonoda  
2nd Author's Affiliation TMC System (TMC System)
3rd Author's Name Keiji Koshida  
3rd Author's Affiliation TMC System (TMC System)
4th Author's Name Mitsuo Kikuchi  
4th Author's Affiliation TMC System (TMC System)
5th Author's Name Hiroaki Kubota  
5th Author's Affiliation TMC System (TMC System)
6th Author's Name Koichiro Sawa  
6th Author's Affiliation Keio Univ. (Keio Univ.)
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2009-02-20 13:20:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # R2008-50, EMD2008-126 
Volume (vol) vol.108 
Number (no) no.433(R), no.434(EMD) 
Page pp.37-42 
#Pages
Date of Issue 2009-02-13 (R, EMD) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan