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| Presentation | 2009-01-29 09:20 Reverse current reduction of Ge pin photodiodes on Si without post-growth annealing Sungbong Park, Shinya Takita, Yasuhiko Ishikawa, Jiro Osaka, Kazumi Wada (Univ. of Tokyo)  PN2008-44 OPE2008-147 LQE2008-144 Link to ES Tech. Rep. Archives: OPE2008-147 LQE2008-144 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | (Not available yet) | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Ge photodiode on Si / Reverse leakage current / Back-end process / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 108, no. 419, LQE2008-144, pp. 11-15, Jan. 2009. | |
| Paper # | LQE2008-144 | |
| Date of Issue | 2009-01-22 (PN, OPE, LQE) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | PN2008-44 OPE2008-147 LQE2008-144 Link to ES Tech. Rep. Archives: OPE2008-147 LQE2008-144 |
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| Conference Information | |
| Committee | PN OPE EMT LQE |
| Conference Date | 2009-01-29 - 2009-01-30 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kyoto Institute Technology (Matsugasaki Campus) |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | LQE |
| Conference Code | 2009-01-PN-OPE-EMT-LQE |
| Language | English |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Reverse current reduction of Ge pin photodiodes on Si without post-growth annealing |
| Sub Title (in English) | |
| Keyword(1) | Ge photodiode on Si |
| Keyword(2) | Reverse leakage current |
| Keyword(3) | Back-end process |
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| 1st Author's Name | Sungbong Park |
| 1st Author's Affiliation | The University of Tokyo (Univ. of Tokyo) |
| 2nd Author's Name | Shinya Takita |
| 2nd Author's Affiliation | The University of Tokyo (Univ. of Tokyo) |
| 3rd Author's Name | Yasuhiko Ishikawa |
| 3rd Author's Affiliation | The University of Tokyo (Univ. of Tokyo) |
| 4th Author's Name | Jiro Osaka |
| 4th Author's Affiliation | The University of Tokyo (Univ. of Tokyo) |
| 5th Author's Name | Kazumi Wada |
| 5th Author's Affiliation | The University of Tokyo (Univ. of Tokyo) |
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| Speaker | Author-1 |
| Date Time | 2009-01-29 09:20:00 |
| Presentation Time | 25 minutes |
| Registration for | LQE |
| Paper # | PN2008-44, OPE2008-147, LQE2008-144 |
| Volume (vol) | vol.108 |
| Number (no) | no.417(PN), no.418(OPE), no.419(LQE) |
| Page | pp.11-15 |
| #Pages | 5 |
| Date of Issue | 2009-01-22 (PN, OPE, LQE) |
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