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| Presentation | 2009-01-23 15:20 Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- for Contact Resistance (III) -- Shin-ichi Wada, Taketo Sonoda, Keiji Koshida, Mitsuo Kikuchi, Hiroaki Kubota (TMC System Co., Ltd.,), Koichiro Sawa (Keio Univ.)  EMD2008-116 Link to ES Tech. Rep. Archives: EMD2008-116 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | The authors have developed the hammering oscillating mechanism which could give real vibration to electrical contacts and studied the influences of a micro-oscillating on contact resistance, and the characteristics of the mechanism has been modeled by PC. By the mechanism the authors made experiments with total operation’s number, about 40 millions. After the term was passed, the contact resistance increased in number to about 200Ω . The tendency continued till the end. Next by using the connectors with smaller contact’s force, the authors made experiments with the same operation’s number. On the contrary, by the sliding contact mechanism the authors made experiments with total operation’s number of 14 millions. After starting, the contact resistance increased to about 200Ω . Although the latter two mechanisms are completely different (in methods, numbers, etc ), the results of two measurements were almost similar on the oscillating phenomenon. It was suggested that the three mechanisms could detect the more real degradation phenomenon on contacts with the influences of micro-vibration by applying the model of fretting corrosion to the fluctuation of contact resistance. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | electrical contact / oscillating mechanism / contact resistance / sliding mechanism / hammering oscillating mechanism / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 108, no. 404, EMD2008-116, pp. 15-20, Jan. 2009. | |
| Paper # | EMD2008-116 | |
| Date of Issue | 2009-01-16 (EMD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EMD2008-116 Link to ES Tech. Rep. Archives: EMD2008-116 |
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| Conference Information | |
| Committee | EMD |
| Conference Date | 2009-01-23 - 2009-01-23 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | EMD |
| Conference Code | 2009-01-EMD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Degradation phenomenon of electrical contacts by hammering oscillating mechanism |
| Sub Title (in English) | for Contact Resistance (III) |
| Keyword(1) | electrical contact |
| Keyword(2) | oscillating mechanism |
| Keyword(3) | contact resistance |
| Keyword(4) | sliding mechanism |
| Keyword(5) | hammering oscillating mechanism |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Shin-ichi Wada |
| 1st Author's Affiliation | TMC SYSTEM CO., LTD. (TMC System Co., Ltd.,) |
| 2nd Author's Name | Taketo Sonoda |
| 2nd Author's Affiliation | TMC SYSTEM CO., LTD. (TMC System Co., Ltd.,) |
| 3rd Author's Name | Keiji Koshida |
| 3rd Author's Affiliation | TMC SYSTEM CO., LTD. (TMC System Co., Ltd.,) |
| 4th Author's Name | Mitsuo Kikuchi |
| 4th Author's Affiliation | TMC SYSTEM CO., LTD. (TMC System Co., Ltd.,) |
| 5th Author's Name | Hiroaki Kubota |
| 5th Author's Affiliation | TMC SYSTEM CO., LTD. (TMC System Co., Ltd.,) |
| 6th Author's Name | Koichiro Sawa |
| 6th Author's Affiliation | Keio University K2 Campus, (Keio Univ.) |
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| Speaker | Author-2 |
| Date Time | 2009-01-23 15:20:00 |
| Presentation Time | 25 minutes |
| Registration for | EMD |
| Paper # | EMD2008-116 |
| Volume (vol) | vol.108 |
| Number (no) | no.404 |
| Page | pp.15-20 |
| #Pages | 6 |
| Date of Issue | 2009-01-16 (EMD) |
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