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| Presentation | 2009-01-23 13:45 Illumination artifact removal using bidimensional empirical mode decomposition Takeshi Oya, Toshihisa Tanaka (TUAT)  SIP2008-161 RCS2008-209 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Images commonly contain some illumination artifacts. When we apply object recognition algorithms for those images, the performance may decrease. To remove the illumination artifact, methods that use empirical mode decomposition (EMD) have been introduced. The EMD provides an adaptive decomposition that decomposes a signal into the so-called intrinsic mode functions (IMFs) and the residue. The residue can be regarded as a component representing the illumination artifact to be removed. However, these methods can lose shades of objects in the original image. In this paper, we propose a method that does not discard the residue but rescale the residue. Experimental results support the analysis. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | empirical mode decomposition / intensity transformation / object recognition / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 108, no. 390, SIP2008-161, pp. 219-224, Jan. 2009. | |
| Paper # | SIP2008-161 | |
| Date of Issue | 2009-01-15 (SIP, RCS) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | SIP2008-161 RCS2008-209 |
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| Conference Information | |
| Committee | SIP RCS |
| Conference Date | 2009-01-22 - 2009-01-23 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kumamoto University |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | SIP |
| Conference Code | 2009-01-SIP-RCS |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Illumination artifact removal using bidimensional empirical mode decomposition |
| Sub Title (in English) | |
| Keyword(1) | empirical mode decomposition |
| Keyword(2) | intensity transformation |
| Keyword(3) | object recognition |
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| 1st Author's Name | Takeshi Oya |
| 1st Author's Affiliation | Tokyo University of Agriculture and Technology (TUAT) |
| 2nd Author's Name | Toshihisa Tanaka |
| 2nd Author's Affiliation | Tokyo University of Agriculture and Technology (TUAT) |
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| Speaker | Author-1 |
| Date Time | 2009-01-23 13:45:00 |
| Presentation Time | 25 minutes |
| Registration for | SIP |
| Paper # | SIP2008-161, RCS2008-209 |
| Volume (vol) | vol.108 |
| Number (no) | no.390(SIP), no.391(RCS) |
| Page | pp.219-224 |
| #Pages | 6 |
| Date of Issue | 2009-01-15 (SIP, RCS) |
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