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Paper Abstract and Keywords
Presentation 2009-01-20 15:15
Diverging SPECT system with a semiconductor detector
Tatsuya Kusayanagi, Koichi Ogawa (Hosei Univ.)
Abstract (in Japanese) (See Japanese page) 
(in English) In a SPECT system with CdTe semiconductor detectors, it is difficult to achieve a wide effective filed-of-view (FOV) due to the manufacturing process and the cost. We therefore proposed a diverging SPECT system which used a diverging collimator and a CdTe detector with a small active area. However, this introduced a problem of a shadow zone in Radon space. To cope with the problem, we introduced the algorithm proposed by Yang et al. into the diverging SPECT system and reconstructed high quality images.
Keyword (in Japanese) (See Japanese page) 
(in English) SPECT / semiconductor detector / diverging collimator / shadow zone / / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 385, MI2008-122, pp. 283-284, Jan. 2009.
Paper # MI2008-122 
Date of Issue 2009-01-12 (MI) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380

Conference Information
Committee MI  
Conference Date 2009-01-19 - 2009-01-21 
Place (in Japanese) (See Japanese page) 
Place (in English) National Taiwan University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Medical Imaging 
Paper Information
Registration To MI 
Conference Code 2009-01-MI 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Diverging SPECT system with a semiconductor detector 
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Keyword(1) SPECT  
Keyword(2) semiconductor detector  
Keyword(3) diverging collimator  
Keyword(4) shadow zone  
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1st Author's Name Tatsuya Kusayanagi  
1st Author's Affiliation Hosei University (Hosei Univ.)
2nd Author's Name Koichi Ogawa  
2nd Author's Affiliation Hosei University (Hosei Univ.)
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Speaker
Date Time 2009-01-20 15:15:00 
Presentation Time 10 
Registration for MI 
Paper # IEICE-MI2008-122 
Volume (vol) IEICE-108 
Number (no) no.385 
Page pp.283-284 
#Pages IEICE-2 
Date of Issue IEICE-MI-2009-01-12 


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