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Paper Abstract and Keywords
Presentation 2008-12-19 16:00
Influence of Built-In Inductor on Rising Part of Discharge Current Waveform for Contact Discharge of ESD-Gun.
Fumihiko Toya, Yoshinori Taka, Osamu Fujiwara (NIT), Shinobu Ishigami, Yukio Yamanaka (NICT) EMCJ2008-99
Abstract (in Japanese) (See Japanese page) 
(in English) The International Electrotechnical Commission (IEC) prescribes an immunity test (IEC61000-4-2) of electronic equipment for electrostatic discharges (ESDs), and specifies not the whole-waveform but only the rise time, the first peak, the levels at 30 ns and 60 ns of a discharge current injected by an ESD gun onto an IEC recommended calibration target, which is being designed to have the same waveform of an observed voltage as that of an injected current. The rise time is required to be within 0.7 ns to 1.0 ns, which can be realized by mounting an inductor in series with a metal electrode for current injection. Due to the impedance of the inductor, however, discharge currents should rise not smoothly but deformedly, which can affect immunity test results. In this study, in order to investigate the effects of a built-in inductor on current rising waveform, we simultaneously measured discharge currents and the resultant magnetic near fields for the contact discharge of an ESD-gun, and compared their results with the case for an ESD-gun with a metal cylinder in lieu of the inductor. As a result, we found that the magnetic near field waveform is deformed by the distortion of the current rising waveform for an ESD-gun with an inductor, while the ESD-gun with a metal cylinder produces no distortion for the current rising waveform despite its rise time (400 ps) shorter than the IEC specification so that there is no distortion for the corresponding magnetic near field waveform. Using the Heidler’s formula for discharge currents, we calculated current rising waveform and the resultant induced output voltage of a magnetic probe. The results show that the case calculated for a built-in inductor is in poor agreement with the measurement, while there is good agreement for the substituted metal cylinder. This finding implies that immunity test results can be affected by the frequency characteristics of a built-in inductor, and thus that not only rise time but also current rising waveform of a discharge current should be specified.
Keyword (in Japanese) (See Japanese page) 
(in English) ESD-gun / contact discharge / discharge current / rising waveform / built-in inductor / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 367, EMCJ2008-99, pp. 75-79, Dec. 2008.
Paper # EMCJ2008-99 
Date of Issue 2008-12-12 (EMCJ) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMCJ  
Conference Date 2008-12-19 - 2008-12-19 
Place (in Japanese) (See Japanese page) 
Place (in English) Gifu Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMCJ 
Conference Code 2008-12-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Influence of Built-In Inductor on Rising Part of Discharge Current Waveform for Contact Discharge of ESD-Gun. 
Sub Title (in English)  
Keyword(1) ESD-gun  
Keyword(2) contact discharge  
Keyword(3) discharge current  
Keyword(4) rising waveform  
Keyword(5) built-in inductor  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Fumihiko Toya  
1st Author's Affiliation Nagoya Institute of Technology (NIT)
2nd Author's Name Yoshinori Taka  
2nd Author's Affiliation Nagoya Institute of Technology (NIT)
3rd Author's Name Osamu Fujiwara  
3rd Author's Affiliation Nagoya Institute of Technology (NIT)
4th Author's Name Shinobu Ishigami  
4th Author's Affiliation National Institute of Information and Communications Technology (NICT)
5th Author's Name Yukio Yamanaka  
5th Author's Affiliation National Institute of Information and Communications Technology (NICT)
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Speaker Author-1 
Date Time 2008-12-19 16:00:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2008-99 
Volume (vol) vol.108 
Number (no) no.367 
Page pp.75-79 
#Pages
Date of Issue 2008-12-12 (EMCJ) 


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