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Paper Abstract and Keywords
Presentation 2008-11-18 14:50
[Invited Talk] LSI,PCB Co-analysis Technology
Toshiro Sato (FUJITSU Advanced Technologies Limited) CPM2008-92 ICD2008-91 Link to ES Tech. Rep. Archives: CPM2008-92 ICD2008-91
Abstract (in Japanese) (See Japanese page) 
(in English) Increase of digital equipment operation frequency and decrease of LSI supply voltage are causing the emerging problem of ground bounce noise,simultaneous switching noise and EMI noise.
We have developed a system that enables us to optimize the noise countermeasure designs by performing the large scale simulation unifying LSI and PCB at the design stages from upper design stage to the verification stage of final design.This system has been applied to the designs and the redesigns caused by noise problems are eradicated.In this paper,the features of the system and results and effectiveness of the application are explained.
Keyword (in Japanese) (See Japanese page) 
(in English) Voltage ground bounce noise / Simultaneous switching noise / PEEC Method / EMI / Circuit simulation / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 302, ICD2008-91, pp. 19-24, Nov. 2008.
Paper # ICD2008-91 
Date of Issue 2008-11-11 (CPM, ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CPM2008-92 ICD2008-91 Link to ES Tech. Rep. Archives: CPM2008-92 ICD2008-91

Conference Information
Committee VLD DC IPSJ-SLDM CPSY RECONF ICD CPM  
Conference Date 2008-11-17 - 2008-11-19 
Place (in Japanese) (See Japanese page) 
Place (in English) Kitakyushu Science and Research Park 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2008 ―New field of VLSI design― 
Paper Information
Registration To ICD 
Conference Code 2008-11-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) LSI,PCB Co-analysis Technology 
Sub Title (in English)  
Keyword(1) Voltage ground bounce noise  
Keyword(2) Simultaneous switching noise  
Keyword(3) PEEC Method  
Keyword(4) EMI  
Keyword(5) Circuit simulation  
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1st Author's Name Toshiro Sato  
1st Author's Affiliation FUJITSU Advanced Technologies Limited (FUJITSU Advanced Technologies Limited)
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Speaker Author-1 
Date Time 2008-11-18 14:50:00 
Presentation Time 45 minutes 
Registration for ICD 
Paper # CPM2008-92, ICD2008-91 
Volume (vol) vol.108 
Number (no) no.301(CPM), no.302(ICD) 
Page pp.19-24 
#Pages
Date of Issue 2008-11-11 (CPM, ICD) 


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