Paper Abstract and Keywords |
Presentation |
2008-10-23 11:10
[Invited Talk]
Analog/RF performance of scaled MOSFET
-- Is scaled MOSFET friend for analog/RF circuits? -- Tatsuya Ohguro (Toshiba) ICD2008-74 Link to ES Tech. Rep. Archives: ICD2008-74 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
High performance has been realized by gate length scaling of MOSFET. Recently, not only gate length scaling but also aggressive advanced technology has been introduced for high performance MOSFET. Those are increase of mobility due to stress for the channel, decrease of gate leakage current by using high K dielectric material and suppression of gate depletion by introducing metal gate electrode. In this paper, the affection to analog / RF performance from those techniques are presented. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Analog / RF / 1/f noise / Vth matching / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 108, no. 253, ICD2008-74, pp. 89-94, Oct. 2008. |
Paper # |
ICD2008-74 |
Date of Issue |
2008-10-15 (ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
ICD2008-74 Link to ES Tech. Rep. Archives: ICD2008-74 |
Conference Information |
Committee |
ICD ITE-IST |
Conference Date |
2008-10-22 - 2008-10-24 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Hokkaido University |
Topics (in Japanese) |
(See Japanese page) |
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Paper Information |
Registration To |
ICD |
Conference Code |
2008-10-ICD-IST |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Analog/RF performance of scaled MOSFET |
Sub Title (in English) |
Is scaled MOSFET friend for analog/RF circuits? |
Keyword(1) |
Analog |
Keyword(2) |
RF |
Keyword(3) |
1/f noise |
Keyword(4) |
Vth matching |
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1st Author's Name |
Tatsuya Ohguro |
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Toshiba semiconductor company (Toshiba) |
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Speaker |
Author-1 |
Date Time |
2008-10-23 11:10:00 |
Presentation Time |
50 minutes |
Registration for |
ICD |
Paper # |
ICD2008-74 |
Volume (vol) |
vol.108 |
Number (no) |
no.253 |
Page |
pp.89-94 |
#Pages |
6 |
Date of Issue |
2008-10-15 (ICD) |