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Paper Abstract and Keywords
Presentation 2008-10-17 15:00
A Study on the Life Characteristics of Iridium Contacts for Ultra-miniature Reed Switches
Yuki Hashimoto, Kazuya Yokoyama, Tatsuo Kobayashi (OSDC) EMD2008-63 Link to ES Tech. Rep. Archives: EMD2008-63
Abstract (in Japanese) (See Japanese page) 
(in English) With application expansion such as test system and communications equipment, various improvements of reed switches are required recently. One of them is miniaturization. The authors have to make the reed size in a glass tube smaller to miniaturize reed switches. However, this has conversely led to the decrease in contact force and thus increased difficulty in maintaining contact capabilities. In this paper, the authors examined iridium as a contact material in which the performance is expected to be higher than that of the rhodium contact that has been used. As a result, in not only a resistive load circuit and a capacitive load circuit but also an inductive load circuit, the authors confirmed that iridium performed better than rhodium and was useful for ultra-miniature reed switch contacts.
Keyword (in Japanese) (See Japanese page) 
(in English) Iridium / Resistive load / Capacitive load / Inductive load / Erosion / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 246, EMD2008-63, pp. 19-24, Oct. 2008.
Paper # EMD2008-63 
Date of Issue 2008-10-10 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2008-63 Link to ES Tech. Rep. Archives: EMD2008-63

Conference Information
Committee EMD  
Conference Date 2008-10-17 - 2008-10-17 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2008-10-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Study on the Life Characteristics of Iridium Contacts for Ultra-miniature Reed Switches 
Sub Title (in English)  
Keyword(1) Iridium  
Keyword(2) Resistive load  
Keyword(3) Capacitive load  
Keyword(4) Inductive load  
Keyword(5) Erosion  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yuki Hashimoto  
1st Author's Affiliation Oki Sensor Device Corporation (OSDC)
2nd Author's Name Kazuya Yokoyama  
2nd Author's Affiliation Oki Sensor Device Corporation (OSDC)
3rd Author's Name Tatsuo Kobayashi  
3rd Author's Affiliation Oki Sensor Device Corporation (OSDC)
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Speaker Author-1 
Date Time 2008-10-17 15:00:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # EMD2008-63 
Volume (vol) vol.108 
Number (no) no.246 
Page pp.19-24 
#Pages
Date of Issue 2008-10-10 (EMD) 


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