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Paper Abstract and Keywords
Presentation 2008-07-18 14:40
Experimental Study on Radiated Electromagnetic Field Strength due to Micro Gap Discharge Below 1kV
Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi, Akira Haga (Tohoku Gakuin Univ.), Osamu Fujiwara (NIT) EMCJ2008-45 EMD2008-27 Link to ES Tech. Rep. Archives: EMD2008-27
Abstract (in Japanese) (See Japanese page) 
(in English) Abstract Relationship between breakdown field strength and radiated electromagnetic field strength was examined in experimental study. In the first, transition duration of voltage and current rise time due to small gap discharge as the low voltage ESD investigated in time domain. The measurement system used the 12GHz experimental system. And so, the sensing system was used an E-field sensor and a H-field sensor. As a consequence of the experiment using the system, voltage and current rise time of transition duration were shown 32 ps or less. Besides, breakdown field was examined to corroborate the very fast transition durations of about 32ps. The breakdown field was very high of about 8x107 V/m in low voltage discharging of below 330V. Also we confirmed that the radiated electromagnetic field strength value in low voltage discharge of about 400V was higher than high voltage discharge of about 900V.
Keyword (in Japanese) (See Japanese page) 
(in English) Breakdown field / Radiated Electromagnetic field / ESD / Micro gap discharge / / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 144, EMCJ2008-45, pp. 27-30, July 2008.
Paper # EMCJ2008-45 
Date of Issue 2008-07-11 (EMCJ, EMD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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技術研究報告に掲載された論文の著作権はIEICEに帰属します.(許諾番号:10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMCJ2008-45 EMD2008-27 Link to ES Tech. Rep. Archives: EMD2008-27

Conference Information
Committee EMCJ EMD  
Conference Date 2008-07-18 - 2008-07-18 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMCJ 
Conference Code 2008-07-EMCJ-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Experimental Study on Radiated Electromagnetic Field Strength due to Micro Gap Discharge Below 1kV 
Sub Title (in English)  
Keyword(1) Breakdown field  
Keyword(2) Radiated Electromagnetic field  
Keyword(3) ESD  
Keyword(4) Micro gap discharge  
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1st Author's Name Ken Kawamata  
1st Author's Affiliation Hachinohe Institute of Technology (Hachinohe Inst. of Tech.)
2nd Author's Name Shigeki Minegishi  
2nd Author's Affiliation Tohoku Gakuin University (Tohoku Gakuin Univ.)
3rd Author's Name Akira Haga  
3rd Author's Affiliation Tohoku Gakuin University (Tohoku Gakuin Univ.)
4th Author's Name Osamu Fujiwara  
4th Author's Affiliation Nagoya Institute of Technology (NIT)
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Speaker
Date Time 2008-07-18 14:40:00 
Presentation Time 25 
Registration for EMCJ 
Paper # IEICE-EMCJ2008-45,IEICE-EMD2008-27 
Volume (vol) IEICE-108 
Number (no) no.144(EMCJ), no.145(EMD) 
Page pp.27-30 
#Pages IEICE-4 
Date of Issue IEICE-EMCJ-2008-07-11,IEICE-EMD-2008-07-11 


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