Paper Abstract and Keywords |
Presentation |
2008-07-18 14:40
Experimental Study on Radiated Electromagnetic Field Strength due to Micro Gap Discharge Below 1kV Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi, Akira Haga (Tohoku Gakuin Univ.), Osamu Fujiwara (NIT) EMCJ2008-45 EMD2008-27 Link to ES Tech. Rep. Archives: EMD2008-27 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Abstract Relationship between breakdown field strength and radiated electromagnetic field strength was examined in experimental study. In the first, transition duration of voltage and current rise time due to small gap discharge as the low voltage ESD investigated in time domain. The measurement system used the 12GHz experimental system. And so, the sensing system was used an E-field sensor and a H-field sensor. As a consequence of the experiment using the system, voltage and current rise time of transition duration were shown 32 ps or less. Besides, breakdown field was examined to corroborate the very fast transition durations of about 32ps. The breakdown field was very high of about 8x107 V/m in low voltage discharging of below 330V. Also we confirmed that the radiated electromagnetic field strength value in low voltage discharge of about 400V was higher than high voltage discharge of about 900V. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Breakdown field / Radiated Electromagnetic field / ESD / Micro gap discharge / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 108, no. 144, EMCJ2008-45, pp. 27-30, July 2008. |
Paper # |
EMCJ2008-45 |
Date of Issue |
2008-07-11 (EMCJ, EMD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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EMCJ2008-45 EMD2008-27 Link to ES Tech. Rep. Archives: EMD2008-27 |
Conference Information |
Committee |
EMCJ EMD |
Conference Date |
2008-07-18 - 2008-07-18 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg |
Topics (in Japanese) |
(See Japanese page) |
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Paper Information |
Registration To |
EMCJ |
Conference Code |
2008-07-EMCJ-EMD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Experimental Study on Radiated Electromagnetic Field Strength due to Micro Gap Discharge Below 1kV |
Sub Title (in English) |
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Keyword(1) |
Breakdown field |
Keyword(2) |
Radiated Electromagnetic field |
Keyword(3) |
ESD |
Keyword(4) |
Micro gap discharge |
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1st Author's Name |
Ken Kawamata |
1st Author's Affiliation |
Hachinohe Institute of Technology (Hachinohe Inst. of Tech.) |
2nd Author's Name |
Shigeki Minegishi |
2nd Author's Affiliation |
Tohoku Gakuin University (Tohoku Gakuin Univ.) |
3rd Author's Name |
Akira Haga |
3rd Author's Affiliation |
Tohoku Gakuin University (Tohoku Gakuin Univ.) |
4th Author's Name |
Osamu Fujiwara |
4th Author's Affiliation |
Nagoya Institute of Technology (NIT) |
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Speaker |
Author-1 |
Date Time |
2008-07-18 14:40:00 |
Presentation Time |
25 minutes |
Registration for |
EMCJ |
Paper # |
EMCJ2008-45, EMD2008-27 |
Volume (vol) |
vol.108 |
Number (no) |
no.144(EMCJ), no.145(EMD) |
Page |
pp.27-30 |
#Pages |
4 |
Date of Issue |
2008-07-11 (EMCJ, EMD) |
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