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Paper Abstract and Keywords
Presentation 2008-07-17 11:50
One-end Two-port Measurement Technique for Four-port S-parameters
Akira Matsuda, Osami Wada, Umberto Paoletti, Takashi Hisakado (Kyoto Univ.) EMCJ2008-31
Abstract (in Japanese) (See Japanese page) 
(in English) One way of evaluating circuit characteristics is to measure the scattering (S)
parameters with a vector network analyzer. Since it is difficult to
set an equipotential ground on high-density boards, the authors propose
a new procedure for four-port circuit measurement, the one-end two-port measurement
technique, which does not require an equipotential ground. In order to use the one-end two-port measurement
technique,the termination condition at two ports on one end is changed with open,
short, and 50-ohm matching, and two-port S-parameters are measured at
two ports on the other end. Four-port S-parameters are calculated from
these results.
Two pairs of expressions are derived using this method.
When expressions are selected to see the effects of termination condition,
the S-parameters are correctly obtained, except for the parameters
between the far-end ports where the
termination condition is changed.
Keyword (in Japanese) (See Japanese page) 
(in English) measurement technique / s-parameters / four-port circuit / one-end measurement / terminal condition / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 132, EMCJ2008-31, pp. 31-36, July 2008.
Paper # EMCJ2008-31 
Date of Issue 2008-07-10 (EMCJ) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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Conference Information
Committee EMCJ  
Conference Date 2008-07-17 - 2008-07-17 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMCJ 
Conference Code 2008-07-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) One-end Two-port Measurement Technique for Four-port S-parameters 
Sub Title (in English)  
Keyword(1) measurement technique  
Keyword(2) s-parameters  
Keyword(3) four-port circuit  
Keyword(4) one-end measurement  
Keyword(5) terminal condition  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Akira Matsuda  
1st Author's Affiliation Kyoto University (Kyoto Univ.)
2nd Author's Name Osami Wada  
2nd Author's Affiliation Kyoto University (Kyoto Univ.)
3rd Author's Name Umberto Paoletti  
3rd Author's Affiliation Kyoto University (Kyoto Univ.)
4th Author's Name Takashi Hisakado  
4th Author's Affiliation Kyoto University (Kyoto Univ.)
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Speaker
Date Time 2008-07-17 11:50:00 
Presentation Time 25 
Registration for EMCJ 
Paper # IEICE-EMCJ2008-31 
Volume (vol) IEICE-108 
Number (no) no.132 
Page pp.31-36 
#Pages IEICE-6 
Date of Issue IEICE-EMCJ-2008-07-10 


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