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| Presentation | 2008-07-17 11:50 One-end Two-port Measurement Technique for Four-port S-parameters Akira Matsuda, Osami Wada, Umberto Paoletti, Takashi Hisakado (Kyoto Univ.)  EMCJ2008-31 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | One way of evaluating circuit characteristics is to measure the scattering (S) parameters with a vector network analyzer. Since it is difficult to set an equipotential ground on high-density boards, the authors propose a new procedure for four-port circuit measurement, the one-end two-port measurement technique, which does not require an equipotential ground. In order to use the one-end two-port measurement technique,the termination condition at two ports on one end is changed with open, short, and 50-ohm matching, and two-port S-parameters are measured at two ports on the other end. Four-port S-parameters are calculated from these results. Two pairs of expressions are derived using this method. When expressions are selected to see the effects of termination condition, the S-parameters are correctly obtained, except for the parameters between the far-end ports where the termination condition is changed. |
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| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | measurement technique / s-parameters / four-port circuit / one-end measurement / terminal condition / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 108, no. 132, EMCJ2008-31, pp. 31-36, July 2008. | |
| Paper # | EMCJ2008-31 | |
| Date of Issue | 2008-07-10 (EMCJ) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EMCJ2008-31 |
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| Conference Information | |
| Committee | EMCJ |
| Conference Date | 2008-07-17 - 2008-07-17 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | EMCJ |
| Conference Code | 2008-07-EMCJ |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | One-end Two-port Measurement Technique for Four-port S-parameters |
| Sub Title (in English) | |
| Keyword(1) | measurement technique |
| Keyword(2) | s-parameters |
| Keyword(3) | four-port circuit |
| Keyword(4) | one-end measurement |
| Keyword(5) | terminal condition |
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| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Akira Matsuda |
| 1st Author's Affiliation | Kyoto University (Kyoto Univ.) |
| 2nd Author's Name | Osami Wada |
| 2nd Author's Affiliation | Kyoto University (Kyoto Univ.) |
| 3rd Author's Name | Umberto Paoletti |
| 3rd Author's Affiliation | Kyoto University (Kyoto Univ.) |
| 4th Author's Name | Takashi Hisakado |
| 4th Author's Affiliation | Kyoto University (Kyoto Univ.) |
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| Speaker | Author-1 |
| Date Time | 2008-07-17 11:50:00 |
| Presentation Time | 25 minutes |
| Registration for | EMCJ |
| Paper # | EMCJ2008-31 |
| Volume (vol) | vol.108 |
| Number (no) | no.132 |
| Page | pp.31-36 |
| #Pages | 6 |
| Date of Issue | 2008-07-10 (EMCJ) |
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