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| Presentation | 2008-06-20 15:50 Improving the Diagnostic Quality of Open Faults Koji Yamazaki, Toshiyuki Tsutsumi (Meiji Univ.), Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo (Ehime Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.), Yuzo Takamatsu (Ehime Univ.)  DC2008-16 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | With the shrinking process technologies and the use of copper process, open defects on interconnect wires, contacts and vias often cause failure. Development of an efficient fault diagnosis method for open faults is desired. In this paper, we propose a method to dianose open faults in which the logical value of the line with open defect is represented as a threshold function of its adjacent lines. By using the threshold function, we can deduce not only a faulty line but also an open defect site at the fault line. Experimental results show that the proposed method can identify an exact faulty line in most cases with a very small computation cost. The proposed method can also identify the open defect site within 25\%-length of the faulty line. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | fault diagnosis / open faults / adjacent lines / threshold function / pass/fail information / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 108, no. 99, DC2008-16, pp. 29-34, June 2008. | |
| Paper # | DC2008-16 | |
| Date of Issue | 2008-06-13 (DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | DC2008-16 |
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| Conference Information | |
| Committee | DC |
| Conference Date | 2008-06-20 - 2008-06-20 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design, Test, Verification |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2008-06-DC |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Improving the Diagnostic Quality of Open Faults |
| Sub Title (in English) | |
| Keyword(1) | fault diagnosis |
| Keyword(2) | open faults |
| Keyword(3) | adjacent lines |
| Keyword(4) | threshold function |
| Keyword(5) | pass/fail information |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Koji Yamazaki |
| 1st Author's Affiliation | Meiji University (Meiji Univ.) |
| 2nd Author's Name | Toshiyuki Tsutsumi |
| 2nd Author's Affiliation | Meiji University (Meiji Univ.) |
| 3rd Author's Name | Hiroshi Takahashi |
| 3rd Author's Affiliation | Ehime University (Ehime Univ.) |
| 4th Author's Name | Yoshinobu Higami |
| 4th Author's Affiliation | Ehime University (Ehime Univ.) |
| 5th Author's Name | Takashi Aikyo |
| 5th Author's Affiliation | Ehime University (Ehime Univ.) |
| 6th Author's Name | Hiroyuki Yotsuyanagi |
| 6th Author's Affiliation | The University of Tokushima (Tokushima Univ.) |
| 7th Author's Name | Masaki Hashizume |
| 7th Author's Affiliation | The University of Tokushima (Tokushima Univ.) |
| 8th Author's Name | Yuzo Takamatsu |
| 8th Author's Affiliation | Ehime University (Ehime Univ.) |
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| Speaker | Author-1 |
| Date Time | 2008-06-20 15:50:00 |
| Presentation Time | 25 minutes |
| Registration for | DC |
| Paper # | DC2008-16 |
| Volume (vol) | vol.108 |
| Number (no) | no.99 |
| Page | pp.29-34 |
| #Pages | 6 |
| Date of Issue | 2008-06-13 (DC) |
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