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Paper Abstract and Keywords
Presentation 2008-05-29 16:40
Displacement current measurement for organic light-emitting diodes containing Alq3; -- Hole accumulation properties at the hetero interface and the effects of light during device fabrication --
Yutaka Noguchi, Naoki Sato, Yuya Tanaka, Yasuo Nakayama, Hisao Ishii (Chiba Univ.) OME2008-31 Link to ES Tech. Rep. Archives: OME2008-31
Abstract (in Japanese) (See Japanese page) 
(in English) We examined the mechanism of charge accumulation in organic light-emitting diodes comprising tris-(8-hydroxyquinolate) aluminum (Alq$_3$) using a displacement current measurement. Depending on the applied biasing voltage, two kinds of accumulation behavior were observed. At the biases lower than the built-in voltage ($V_{\mathrm{bi}}$), the amount of hole accumulated at 4,4$^{\prime}$-bis[N-(1-naphthyl)-N-phenylamino]-biphenyl/Alq$_3$ is dominated by the negative charge at the interface, but at the biases higher than $V_{\mathrm{bi}}$, it is determined by the conductivity of each layer. In addition, we found that light irradiation during the device fabrication significantly reduces the amount of hole accumulated at the interface, suggesting that the orientation polarization in Alq$_3$ film is responsible for the charge accumulation properties.
Keyword (in Japanese) (See Japanese page) 
(in English) organic light-emitting diode / charge accumulation / displacement current masurement / interfacial charge / giant surface potential / / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 59, OME2008-31, pp. 55-60, May 2008.
Paper # OME2008-31 
Date of Issue 2008-05-22 (OME) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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Download PDF OME2008-31 Link to ES Tech. Rep. Archives: OME2008-31

Conference Information
Committee OME  
Conference Date 2008-05-29 - 2008-05-29 
Place (in Japanese) (See Japanese page) 
Place (in English) Denki-Club, Meeting room 3 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Electronic organic materials 
Paper Information
Registration To OME 
Conference Code 2008-05-OME 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Displacement current measurement for organic light-emitting diodes containing Alq3; 
Sub Title (in English) Hole accumulation properties at the hetero interface and the effects of light during device fabrication 
Keyword(1) organic light-emitting diode  
Keyword(2) charge accumulation  
Keyword(3) displacement current masurement  
Keyword(4) interfacial charge  
Keyword(5) giant surface potential  
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1st Author's Name Yutaka Noguchi  
1st Author's Affiliation Chiba University (Chiba Univ.)
2nd Author's Name Naoki Sato  
2nd Author's Affiliation Chiba University (Chiba Univ.)
3rd Author's Name Yuya Tanaka  
3rd Author's Affiliation Chiba University (Chiba Univ.)
4th Author's Name Yasuo Nakayama  
4th Author's Affiliation Chiba University (Chiba Univ.)
5th Author's Name Hisao Ishii  
5th Author's Affiliation Chiba University (Chiba Univ.)
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Speaker Author-1 
Date Time 2008-05-29 16:40:00 
Presentation Time 20 minutes 
Registration for OME 
Paper # OME2008-31 
Volume (vol) vol.108 
Number (no) no.59 
Page pp.55-60 
#Pages
Date of Issue 2008-05-22 (OME) 


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