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Paper Abstract and Keywords
Presentation 2008-04-18 11:15
[Invited Talk] Current Status of Impact and Countermeasures in Environmental Neutron Induced Failures in Electric Systems -- Evolution of Multi-Node Upset Issues --
Eishi Ibe (PERL) ICD2008-10 Link to ES Tech. Rep. Archives: ICD2008-10
Abstract (in Japanese) (See Japanese page) 
(in English) Environmental neutrons is being widely recognized as the most significant source of a variety of error modes in semiconductor devices from late 90s. International defacto- or dejule standards are being established to fix standard test methods to quantify the vulnerability of the semiconductor devices to such radiation sources. The present paper summarizes the current status of the error modes, experimental and simulation/analysis methods, and possible/existing countermeasures.
Keyword (in Japanese) (See Japanese page) 
(in English) neutron / soft-error / SEFI / MCU / MCBI / Multi-node upset / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 6, ICD2008-10, pp. 51-56, April 2008.
Paper # ICD2008-10 
Date of Issue 2008-04-10 (ICD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ICD2008-10 Link to ES Tech. Rep. Archives: ICD2008-10

Conference Information
Committee ICD  
Conference Date 2008-04-17 - 2008-04-18 
Place (in Japanese) (See Japanese page) 
Place (in English)  
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Topics (in English)  
Paper Information
Registration To ICD 
Conference Code 2008-04-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Current Status of Impact and Countermeasures in Environmental Neutron Induced Failures in Electric Systems 
Sub Title (in English) Evolution of Multi-Node Upset Issues 
Keyword(1) neutron  
Keyword(2) soft-error  
Keyword(3) SEFI  
Keyword(4) MCU  
Keyword(5) MCBI  
Keyword(6) Multi-node upset  
1st Author's Name Eishi Ibe  
1st Author's Affiliation Production Engineering Research Laboratory, Hitachi, Ltd. (PERL)
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Date Time 2008-04-18 11:15:00 
Presentation Time 50 
Registration for ICD 
Paper # IEICE-ICD2008-10 
Volume (vol) IEICE-108 
Number (no) no.6 
Page pp.51-56 
#Pages IEICE-6 
Date of Issue IEICE-ICD-2008-04-10 

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