Paper Abstract and Keywords |
Presentation |
2008-04-18 11:15
[Invited Talk]
Current Status of Impact and Countermeasures in Environmental Neutron Induced Failures in Electric Systems
-- Evolution of Multi-Node Upset Issues -- Eishi Ibe (PERL) ICD2008-10 Link to ES Tech. Rep. Archives: ICD2008-10 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Environmental neutrons is being widely recognized as the most significant source of a variety of error modes in semiconductor devices from late 90s. International defacto- or dejule standards are being established to fix standard test methods to quantify the vulnerability of the semiconductor devices to such radiation sources. The present paper summarizes the current status of the error modes, experimental and simulation/analysis methods, and possible/existing countermeasures. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
neutron / soft-error / SEFI / MCU / MCBI / Multi-node upset / / |
Reference Info. |
IEICE Tech. Rep., vol. 108, no. 6, ICD2008-10, pp. 51-56, April 2008. |
Paper # |
ICD2008-10 |
Date of Issue |
2008-04-10 (ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
ICD2008-10 Link to ES Tech. Rep. Archives: ICD2008-10 |
Conference Information |
Committee |
ICD |
Conference Date |
2008-04-17 - 2008-04-18 |
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(See Japanese page) |
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Paper Information |
Registration To |
ICD |
Conference Code |
2008-04-ICD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Current Status of Impact and Countermeasures in Environmental Neutron Induced Failures in Electric Systems |
Sub Title (in English) |
Evolution of Multi-Node Upset Issues |
Keyword(1) |
neutron |
Keyword(2) |
soft-error |
Keyword(3) |
SEFI |
Keyword(4) |
MCU |
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MCBI |
Keyword(6) |
Multi-node upset |
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Keyword(8) |
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1st Author's Name |
Eishi Ibe |
1st Author's Affiliation |
Production Engineering Research Laboratory, Hitachi, Ltd. (PERL) |
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Speaker |
Author-1 |
Date Time |
2008-04-18 11:15:00 |
Presentation Time |
50 minutes |
Registration for |
ICD |
Paper # |
ICD2008-10 |
Volume (vol) |
vol.108 |
Number (no) |
no.6 |
Page |
pp.51-56 |
#Pages |
6 |
Date of Issue |
2008-04-10 (ICD) |