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| Presentation | 2008-03-06 15:45 Superposition Effect Validation of Inductive Coupling Noise Based on Measurement of Interconnect Delay Variation Yasuhiro Ogasahara, Masanori Hashimoto, Takao Onoye (Osaka Univ.)  VLD2007-153 ICD2007-176 Link to ES Tech. Rep. Archives: ICD2007-176 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Inductive coupling is becoming a design concern for global interconnects in nano-meter technologies. This paper measures the interconnect delay variation due to inductive coupling noise in a 90nm technology. Superposition of noise effect from many aggressors, and cancellation due to opposite noise effects are verified based on measurement results. Measurement result also indicates that delay variation due to many aggressors can be approximated with summation of delay variation due to each individual aggressor. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | signal integrity / measurement / inductive coupling noise / noise superposition / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 107, no. 510, ICD2007-176, pp. 55-60, March 2008. | |
| Paper # | ICD2007-176 | |
| Date of Issue | 2008-02-28 (VLD, ICD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | VLD2007-153 ICD2007-176 Link to ES Tech. Rep. Archives: ICD2007-176 |
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| Conference Information | |
| Committee | VLD ICD |
| Conference Date | 2008-03-05 - 2008-03-07 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | TiRuRu |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | System-on-silicon design techniques and related VLSs |
| Paper Information | |
| Registration To | ICD |
| Conference Code | 2008-03-VLD-ICD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Superposition Effect Validation of Inductive Coupling Noise Based on Measurement of Interconnect Delay Variation |
| Sub Title (in English) | |
| Keyword(1) | signal integrity |
| Keyword(2) | measurement |
| Keyword(3) | inductive coupling noise |
| Keyword(4) | noise superposition |
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| 1st Author's Name | Yasuhiro Ogasahara |
| 1st Author's Affiliation | Osaka University (Osaka Univ.) |
| 2nd Author's Name | Masanori Hashimoto |
| 2nd Author's Affiliation | Osaka University (Osaka Univ.) |
| 3rd Author's Name | Takao Onoye |
| 3rd Author's Affiliation | Osaka University (Osaka Univ.) |
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| Speaker | Author-1 |
| Date Time | 2008-03-06 15:45:00 |
| Presentation Time | 25 minutes |
| Registration for | ICD |
| Paper # | VLD2007-153, ICD2007-176 |
| Volume (vol) | vol.107 |
| Number (no) | no.507(VLD), no.510(ICD) |
| Page | pp.55-60 |
| #Pages | 6 |
| Date of Issue | 2008-02-28 (VLD, ICD) |
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