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Paper Abstract and Keywords
Presentation 2008-02-15 14:55
Accuracy Improvement of Dual Wavelength Push-pull Reflectometry (DWPR) Using a Total Reflector
Yasutoshi Komatsu, Keiichi Inoue, Seiichi Onoda (Watanabe Co.,Ltd.,), Nobuo Tsukamoto (DSP Technology Associaetes, Inc.) R2007-65 EMD2007-120 Link to ES Tech. Rep. Archives: EMD2007-120
Abstract (in Japanese) (See Japanese page) 
(in English) DWPR method uses an optical reflective sensor attached at the end of an optical fiber. The reflectance of the sensor varies in a complementary push-pull manner for two different wavelengths depending on the physical quantity to be measured. The fluctuation of the optical output level causes a measurement error in DWPR. We investigated a method to eliminate this error and found the error caused by long-period variation could be effectively reduced using a total reflector.
Analytical and experimental results are presented here.
Keyword (in Japanese) (See Japanese page) 
(in English) DWPR / Reflectance Ratio / Total Reflector / Optical Level Fluctuation / / / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 485, EMD2007-120, pp. 37-42, Feb. 2008.
Paper # EMD2007-120 
Date of Issue 2008-02-08 (R, EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2007-65 EMD2007-120 Link to ES Tech. Rep. Archives: EMD2007-120

Conference Information
Committee EMD R  
Conference Date 2008-02-15 - 2008-02-15 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2008-02-EMD-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Accuracy Improvement of Dual Wavelength Push-pull Reflectometry (DWPR) Using a Total Reflector 
Sub Title (in English)  
Keyword(1) DWPR  
Keyword(2) Reflectance Ratio  
Keyword(3) Total Reflector  
Keyword(4) Optical Level Fluctuation  
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1st Author's Name Yasutoshi Komatsu  
1st Author's Affiliation Watanabe Co.,Ltd., (Watanabe Co.,Ltd.,)
2nd Author's Name Keiichi Inoue  
2nd Author's Affiliation Watanabe Co.,Ltd., (Watanabe Co.,Ltd.,)
3rd Author's Name Seiichi Onoda  
3rd Author's Affiliation Watanabe Co.,Ltd., (Watanabe Co.,Ltd.,)
4th Author's Name Nobuo Tsukamoto  
4th Author's Affiliation DSP Technology Associaetes, Inc. (DSP Technology Associaetes, Inc.)
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Speaker Author-1 
Date Time 2008-02-15 14:55:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # R2007-65, EMD2007-120 
Volume (vol) vol.107 
Number (no) no.484(R), no.485(EMD) 
Page pp.37-42 
#Pages
Date of Issue 2008-02-08 (R, EMD) 


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