Paper Abstract and Keywords |
Presentation |
2008-02-15 14:55
Accuracy Improvement of Dual Wavelength Push-pull Reflectometry (DWPR) Using a Total Reflector Yasutoshi Komatsu, Keiichi Inoue, Seiichi Onoda (Watanabe Co.,Ltd.,), Nobuo Tsukamoto (DSP Technology Associaetes, Inc.) R2007-65 EMD2007-120 Link to ES Tech. Rep. Archives: EMD2007-120 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
DWPR method uses an optical reflective sensor attached at the end of an optical fiber. The reflectance of the sensor varies in a complementary push-pull manner for two different wavelengths depending on the physical quantity to be measured. The fluctuation of the optical output level causes a measurement error in DWPR. We investigated a method to eliminate this error and found the error caused by long-period variation could be effectively reduced using a total reflector.
Analytical and experimental results are presented here. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
DWPR / Reflectance Ratio / Total Reflector / Optical Level Fluctuation / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 107, no. 485, EMD2007-120, pp. 37-42, Feb. 2008. |
Paper # |
EMD2007-120 |
Date of Issue |
2008-02-08 (R, EMD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
R2007-65 EMD2007-120 Link to ES Tech. Rep. Archives: EMD2007-120 |
Conference Information |
Committee |
EMD R |
Conference Date |
2008-02-15 - 2008-02-15 |
Place (in Japanese) |
(See Japanese page) |
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Topics (in Japanese) |
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Paper Information |
Registration To |
EMD |
Conference Code |
2008-02-EMD-R |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Accuracy Improvement of Dual Wavelength Push-pull Reflectometry (DWPR) Using a Total Reflector |
Sub Title (in English) |
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Keyword(1) |
DWPR |
Keyword(2) |
Reflectance Ratio |
Keyword(3) |
Total Reflector |
Keyword(4) |
Optical Level Fluctuation |
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1st Author's Name |
Yasutoshi Komatsu |
1st Author's Affiliation |
Watanabe Co.,Ltd., (Watanabe Co.,Ltd.,) |
2nd Author's Name |
Keiichi Inoue |
2nd Author's Affiliation |
Watanabe Co.,Ltd., (Watanabe Co.,Ltd.,) |
3rd Author's Name |
Seiichi Onoda |
3rd Author's Affiliation |
Watanabe Co.,Ltd., (Watanabe Co.,Ltd.,) |
4th Author's Name |
Nobuo Tsukamoto |
4th Author's Affiliation |
DSP Technology Associaetes, Inc. (DSP Technology Associaetes, Inc.) |
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Speaker |
Author-1 |
Date Time |
2008-02-15 14:55:00 |
Presentation Time |
25 minutes |
Registration for |
EMD |
Paper # |
R2007-65, EMD2007-120 |
Volume (vol) |
vol.107 |
Number (no) |
no.484(R), no.485(EMD) |
Page |
pp.37-42 |
#Pages |
6 |
Date of Issue |
2008-02-08 (R, EMD) |
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