Paper Abstract and Keywords |
Presentation |
2008-02-08 16:55
Fault Diagnosis of Analog Circuits by Using Multiple Transistors and Data Samplings Jiro Kato, Yukiya Miura (Tokyo Metropolitan Univ.) DC2007-82 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In this paper, we propose two methods for diagnosing analog circuits by using multiple transistors and data samplings, which are based on the operation-region model and the X-Y zoning method. The X-Y zoning method uses the characteristics of circuit input voltage and output voltage. The operation-region model can be used for modeling circuit behaviors by utilizing changes in the operation regions of MOS transistors. We demonstrate the effectiveness of the proposed methods by applying them to ITC’97 benchmark circuits with hard faults and soft faults. These methods can improve diagnostic performance and reduce a diagnostic sequence length and processing time. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Analog Circuits / Fault diagnosis / MOS transistors / Operation-region model / X-Y zoning method / / / |
Reference Info. |
IEICE Tech. Rep., vol. 107, no. 482, DC2007-82, pp. 95-100, Feb. 2008. |
Paper # |
DC2007-82 |
Date of Issue |
2008-02-01 (DC) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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DC2007-82 |
Conference Information |
Committee |
DC |
Conference Date |
2008-02-08 - 2008-02-08 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
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Paper Information |
Registration To |
DC |
Conference Code |
2008-02-DC |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Fault Diagnosis of Analog Circuits by Using Multiple Transistors and Data Samplings |
Sub Title (in English) |
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Keyword(1) |
Analog Circuits |
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Fault diagnosis |
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MOS transistors |
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Operation-region model |
Keyword(5) |
X-Y zoning method |
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1st Author's Name |
Jiro Kato |
1st Author's Affiliation |
Tokyo Metropolitan University (Tokyo Metropolitan Univ.) |
2nd Author's Name |
Yukiya Miura |
2nd Author's Affiliation |
Tokyo Metropolitan University (Tokyo Metropolitan Univ.) |
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Speaker |
Author-1 |
Date Time |
2008-02-08 16:55:00 |
Presentation Time |
25 minutes |
Registration for |
DC |
Paper # |
DC2007-82 |
Volume (vol) |
vol.107 |
Number (no) |
no.482 |
Page |
pp.95-100 |
#Pages |
6 |
Date of Issue |
2008-02-01 (DC) |