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| Presentation | 2008-02-08 09:25 Fault Diagnosis for Dyinamic Open Faults with Considering Adjacent Lines Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Syuhei Kadoyama, Tetsuya Watanabe, Yuzo Takamatsu (Ehime Univ.), Toshiyuki Tsutsumi, Kouji Yamazaki (Meiji Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. of Tokushima)  DC2007-68 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | In modern manufacturing technologies with the shrinking of manufacturing process, LSIs may have several metal interconnect layers and the long copper(Cu) interconnect wires. Under the modern manufacturing technologies, the open defect is the one of the significant issues to maintain the reliability of LSI. In this paper, we propose a dynamic open fault model with considering the affects of the adjacent lines. Under the open fault model, the fault is excited depending on the signal transitions at the adjacent lines that are assigned by the pair of test patterns. Next, we propose the diagnosis method based on the dynamic open fault model. The proposed method uses not only fail test patterns but also the pass test patterns. Base on results of the diagnostic fault simulation, the candidate faults are ranked. Experimental results show that the proposed method is able to diagnose the open faults. |
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| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | open faults / fault diagnosis / fail test patteren / pass test pattern / diagnostic fault simulation / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 107, no. 482, DC2007-68, pp. 7-12, Feb. 2008. | |
| Paper # | DC2007-68 | |
| Date of Issue | 2008-02-01 (DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | DC2007-68 |
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| Conference Information | |
| Committee | DC |
| Conference Date | 2008-02-08 - 2008-02-08 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2008-02-DC |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Fault Diagnosis for Dyinamic Open Faults with Considering Adjacent Lines |
| Sub Title (in English) | |
| Keyword(1) | open faults |
| Keyword(2) | fault diagnosis |
| Keyword(3) | fail test patteren |
| Keyword(4) | pass test pattern |
| Keyword(5) | diagnostic fault simulation |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Hiroshi Takahashi |
| 1st Author's Affiliation | Ehime University (Ehime Univ.) |
| 2nd Author's Name | Yoshinobu Higami |
| 2nd Author's Affiliation | Ehime University (Ehime Univ.) |
| 3rd Author's Name | Takashi Aikyo |
| 3rd Author's Affiliation | Ehime University (Ehime Univ.) |
| 4th Author's Name | Syuhei Kadoyama |
| 4th Author's Affiliation | Ehime University (Ehime Univ.) |
| 5th Author's Name | Tetsuya Watanabe |
| 5th Author's Affiliation | Ehime University (Ehime Univ.) |
| 6th Author's Name | Yuzo Takamatsu |
| 6th Author's Affiliation | Ehime University (Ehime Univ.) |
| 7th Author's Name | Toshiyuki Tsutsumi |
| 7th Author's Affiliation | Meiji University (Meiji Univ.) |
| 8th Author's Name | Kouji Yamazaki |
| 8th Author's Affiliation | Meiji University (Meiji Univ.) |
| 9th Author's Name | Hiroyuki Yotsuyanagi |
| 9th Author's Affiliation | Univeresity of Tokushima (Univ. of Tokushima) |
| 10th Author's Name | Masaki Hashizume |
| 10th Author's Affiliation | Univeresity of Tokushima (Univ. of Tokushima) |
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| Speaker | Author-5 |
| Date Time | 2008-02-08 09:25:00 |
| Presentation Time | 25 minutes |
| Registration for | DC |
| Paper # | DC2007-68 |
| Volume (vol) | vol.107 |
| Number (no) | no.482 |
| Page | pp.7-12 |
| #Pages | 6 |
| Date of Issue | 2008-02-01 (DC) |
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