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| Presentation | 2008-02-08 09:50 Diagnostic Test Generation for Transition Faults Takashi Aikyo, Yoshinobu Higami, Hiroshi Takahashi, Toru Kikkawa, Yuzo Takamatsu (Ehime Univ.)  DC2007-69 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | In modern manufacturing technologies with the shrinking of manufacturing process, LSIs may have several metal interconnect layers and the long copper(Cu) interconnect wires. Under the modern manufacturing technologies, the open defect is the one of the significant issues to maintain the reliability of LSI. The open defects at the interconnects are caused by scratches and/or voids in the interconnects such as wires, contacts, and vias. However, the modeling and techniques for test and diagnosis for open faults have been not established yet. In this paper, we propose new open fault model with considering the affects of adjacent lines. Under the open fault model, the fault is excited depending on the logic values at the adjacent lines that are assigned by the test. Next, we propose the diagnosis method based on the open fault model. We use the detecting/un-detecting information based on the excitation condition with considering the logic values at the adjacent lines and the fault propagation condition to deduce the candidate open fault. Experimental results show that the proposed method based on the detecting/un-detecting information is able to diagnose the open faults. |
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| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Diagnostic Test / Test Generation / Transition Fault / Delay Fault / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 107, no. 482, DC2007-69, pp. 13-18, Feb. 2008. | |
| Paper # | DC2007-69 | |
| Date of Issue | 2008-02-01 (DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | DC2007-69 |
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| Conference Information | |
| Committee | DC |
| Conference Date | 2008-02-08 - 2008-02-08 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2008-02-DC |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Diagnostic Test Generation for Transition Faults |
| Sub Title (in English) | |
| Keyword(1) | Diagnostic Test |
| Keyword(2) | Test Generation |
| Keyword(3) | Transition Fault |
| Keyword(4) | Delay Fault |
| Keyword(5) | |
| Keyword(6) | |
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| Keyword(8) | |
| 1st Author's Name | Takashi Aikyo |
| 1st Author's Affiliation | Ehime University (Ehime Univ.) |
| 2nd Author's Name | Yoshinobu Higami |
| 2nd Author's Affiliation | Ehime University (Ehime Univ.) |
| 3rd Author's Name | Hiroshi Takahashi |
| 3rd Author's Affiliation | Ehime University (Ehime Univ.) |
| 4th Author's Name | Toru Kikkawa |
| 4th Author's Affiliation | Ehime University (Ehime Univ.) |
| 5th Author's Name | Yuzo Takamatsu |
| 5th Author's Affiliation | Ehime University (Ehime Univ.) |
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| Speaker | Author-4 |
| Date Time | 2008-02-08 09:50:00 |
| Presentation Time | 25 minutes |
| Registration for | DC |
| Paper # | DC2007-69 |
| Volume (vol) | vol.107 |
| Number (no) | no.482 |
| Page | pp.13-18 |
| #Pages | 6 |
| Date of Issue | 2008-02-01 (DC) |
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