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Paper Abstract and Keywords
Presentation 2008-01-29 09:30
Influence of Band Offset on Carrier Lifetime in Quantum Well Lasers
Shinichi Kakuda, Hideaki Nishimura, Masashi Tanaka, Wataru Susaki (OECU) PN2007-55 OPE2007-163 LQE2007-141 Link to ES Tech. Rep. Archives: OPE2007-163 LQE2007-141
Abstract (in Japanese) (See Japanese page) 
(in English) Carrier recombination lifetime of various kinds of separate-confinement quantum well lasers formed on GaAs and InP substrates has been systematically measured by lasing delay time. It decreases by overflow of electrons below threshold in lasers with small band offset energy between the quantum well and the waveguide/barrier layers. Decrease of carrier recombination lifetime might be due to the increase of non-lasing recombination of electrons injected into the electron -confining-well formed by Coulomb attractive force between overflowing electrons and confined holes in the quantum well.
Keyword (in Japanese) (See Japanese page) 
(in English) Quantum Well / Carrier Recombination Lifetime / Band Offset / Electron Overflow / / / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 466, LQE2007-141, pp. 101-106, Jan. 2008.
Paper # LQE2007-141 
Date of Issue 2008-01-21 (PN, OPE, LQE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF PN2007-55 OPE2007-163 LQE2007-141 Link to ES Tech. Rep. Archives: OPE2007-163 LQE2007-141

Conference Information
Committee EMT LQE OPE PN  
Conference Date 2008-01-28 - 2008-01-29 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
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Paper Information
Registration To LQE 
Conference Code 2008-01-EMT-LQE-OPE-PN 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Influence of Band Offset on Carrier Lifetime in Quantum Well Lasers 
Sub Title (in English)  
Keyword(1) Quantum Well  
Keyword(2) Carrier Recombination Lifetime  
Keyword(3) Band Offset  
Keyword(4) Electron Overflow  
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1st Author's Name Shinichi Kakuda  
1st Author's Affiliation Osaka Electro-Communication University (OECU)
2nd Author's Name Hideaki Nishimura  
2nd Author's Affiliation Osaka Electro-Communication University (OECU)
3rd Author's Name Masashi Tanaka  
3rd Author's Affiliation Osaka Electro-Communication University (OECU)
4th Author's Name Wataru Susaki  
4th Author's Affiliation Osaka Electro-Communication University (OECU)
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Speaker Author-1 
Date Time 2008-01-29 09:30:00 
Presentation Time 25 minutes 
Registration for LQE 
Paper # PN2007-55, OPE2007-163, LQE2007-141 
Volume (vol) vol.107 
Number (no) no.464(PN), no.465(OPE), no.466(LQE) 
Page pp.101-106 
#Pages
Date of Issue 2008-01-21 (PN, OPE, LQE) 


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