Paper Abstract and Keywords |
Presentation |
2007-12-18 09:30
Proposal of a Test Case Generation Method for Enbedded Systems from Sequence Diagram Yo Inoue, Tetsuro Katayama (Univ of Miyazaki) SS2007-52 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
An efficient testing to keep the quality of products is required in embedded system development.
But, test-cases are made according to the experience and capability of a tester.
This paper proposes a test case generation method for the efficient testing.
Concretely, test-cases and a table that expresses timing of user actions from a sequence diagram of UML(Unified Modeling Language) are generated.
By using this method, discovering lack of specification, and improving of productivity of testing can be expected. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
UML(Unified Modeling Language) / test-case / sequence diagram / MBT(Model-Based Testing) / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 107, no. 392, SS2007-52, pp. 85-90, Dec. 2007. |
Paper # |
SS2007-52 |
Date of Issue |
2007-12-10 (SS) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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SS2007-52 |
Conference Information |
Committee |
SS |
Conference Date |
2007-12-17 - 2007-12-18 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Shimane Univ. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
general |
Paper Information |
Registration To |
SS |
Conference Code |
2007-12-SS |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Proposal of a Test Case Generation Method for Enbedded Systems from Sequence Diagram |
Sub Title (in English) |
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Keyword(1) |
UML(Unified Modeling Language) |
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test-case |
Keyword(3) |
sequence diagram |
Keyword(4) |
MBT(Model-Based Testing) |
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1st Author's Name |
Yo Inoue |
1st Author's Affiliation |
Univercity of Miyazaki (Univ of Miyazaki) |
2nd Author's Name |
Tetsuro Katayama |
2nd Author's Affiliation |
Univercity of Miyazaki (Univ of Miyazaki) |
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Speaker |
Author-1 |
Date Time |
2007-12-18 09:30:00 |
Presentation Time |
30 minutes |
Registration for |
SS |
Paper # |
SS2007-52 |
Volume (vol) |
vol.107 |
Number (no) |
no.392 |
Page |
pp.85-90 |
#Pages |
6 |
Date of Issue |
2007-12-10 (SS) |
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