| IEICE Technical Committee Submission System Conference Paper's Information |
Online Proceedings [Sign in] Tech. Rep. Archives |
| Go Top Page | Go Previous | [Japanese] / [English] |
| Paper Abstract and Keywords | ||
| Presentation | 2007-11-22 09:25 A New Technique for Elimination of Irregular Data in Measured Values -- A Data Screening Technique Appling Skewness of Basic Statistic -- Shin-ichi Ohkawa, Hiroo Masuda (Renesas)  VLD2007-90 DC2007-45 |
|
| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Consideration of device variation in VLSI design, at present or in future, is very important concerns. Moreover, in each stage of device measurement, variation modeling or reflection on design, there are many steps of developments of technology. And then, many technologies are novel one needing unique basic concept. As one of such many problems, we have developed a new technique which eliminates irregular data in measured values. Skewness of basic statistic is applied to this. Side effects are small for regular data, while it eliminates irregular data efficiently A Reliability of large scale measurements, which is needed for evaluation of devise variation, is remarkably improved. |
|
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | LSI / design / variation / irregular value / screening / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 107, no. 336, VLD2007-90, pp. 7-12, Nov. 2007. | |
| Paper # | VLD2007-90 | |
| Date of Issue | 2007-11-15 (VLD, DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | VLD2007-90 DC2007-45 |
|
| Conference Information | |
| Committee | VLD CPSY RECONF DC IPSJ-SLDM IPSJ-ARC |
| Conference Date | 2007-11-20 - 2007-11-22 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kitakyushu International Conference Center |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design Gaia 2007 ---A New Frontier in VLSI Design--- |
| Paper Information | |
| Registration To | VLD |
| Conference Code | 2007-11-VLD-CPSY-RECONF-DC-IPSJ-SLDM-IPSJ-ARC |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A New Technique for Elimination of Irregular Data in Measured Values |
| Sub Title (in English) | A Data Screening Technique Appling Skewness of Basic Statistic |
| Keyword(1) | LSI |
| Keyword(2) | design |
| Keyword(3) | variation |
| Keyword(4) | irregular value |
| Keyword(5) | screening |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Shin-ichi Ohkawa |
| 1st Author's Affiliation | Renesas Technology (Renesas) |
| 2nd Author's Name | Hiroo Masuda |
| 2nd Author's Affiliation | Renesas Technology (Renesas) |
| 3rd Author's Name | |
| 3rd Author's Affiliation | () |
| 4th Author's Name | |
| 4th Author's Affiliation | () |
| 5th Author's Name | |
| 5th Author's Affiliation | () |
| 6th Author's Name | |
| 6th Author's Affiliation | () |
| 7th Author's Name | |
| 7th Author's Affiliation | () |
| 8th Author's Name | |
| 8th Author's Affiliation | () |
| 9th Author's Name | |
| 9th Author's Affiliation | () |
| 10th Author's Name | |
| 10th Author's Affiliation | () |
| 11th Author's Name | |
| 11th Author's Affiliation | () |
| 12th Author's Name | |
| 12th Author's Affiliation | () |
| 13th Author's Name | |
| 13th Author's Affiliation | () |
| 14th Author's Name | |
| 14th Author's Affiliation | () |
| 15th Author's Name | |
| 15th Author's Affiliation | () |
| 16th Author's Name | |
| 16th Author's Affiliation | () |
| 17th Author's Name | |
| 17th Author's Affiliation | () |
| 18th Author's Name | |
| 18th Author's Affiliation | () |
| Speaker | Author-1 |
| Date Time | 2007-11-22 09:25:00 |
| Presentation Time | 25 minutes |
| Registration for | VLD |
| Paper # | VLD2007-90, DC2007-45 |
| Volume (vol) | vol.107 |
| Number (no) | no.336(VLD), no.339(DC) |
| Page | pp.7-12 |
| #Pages | 6 |
| Date of Issue | 2007-11-15 (VLD, DC) |
[Return to Top Page]