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Paper Abstract and Keywords
Presentation 2007-11-16 12:55
Fabrication and characterization of Bi-based high-Tc superconductor devices
Takashi Yoshida, Hiroaki Nawa, Hayataka Tominaga, Atsushi Miwa, Takahiro Kato, Katsuyoshi Hamasaki (NUT), Hisashi Shimakage (NICT) CPM2007-106 Link to ES Tech. Rep. Archives: CPM2007-106
Abstract (in Japanese) (See Japanese page) 
(in English) FIB (Focused Ion Beam) and double-side fabrication techniques were widely used to fabricate intrinsic Josephson junctions (IJJs) inside Bi-2212 single crystals. Main feature of such technique is able to remove the contact resistance of the Bi-2212/Au (or Ag). We have previously fabricated self-planarized Bi-2212 IJJs using acid-treated process. In this process, the Bi-2212 single crystal around the stack is varied to transparent and insulating material by soaking it into the dilute hydrochloric acid (pH≧1.4). In this study, we developed a new process to fabricate the IJJs inside the crystal using the transparent material.
Keyword (in Japanese) (See Japanese page) 
(in English) intrinsic Josephson junctions(IJJs) / acid-treated process / IJJs inside Bi-2212 single crystal / / / / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 325, CPM2007-106, pp. 7-11, Nov. 2007.
Paper # CPM2007-106 
Date of Issue 2007-11-09 (CPM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CPM2007-106 Link to ES Tech. Rep. Archives: CPM2007-106

Conference Information
Committee CPM  
Conference Date 2007-11-16 - 2007-11-17 
Place (in Japanese) (See Japanese page) 
Place (in English) Nagaoka University of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Process of Thin Film formation and Materials, etc. 
Paper Information
Registration To CPM 
Conference Code 2007-11-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Fabrication and characterization of Bi-based high-Tc superconductor devices 
Sub Title (in English)  
Keyword(1) intrinsic Josephson junctions(IJJs)  
Keyword(2) acid-treated process  
Keyword(3) IJJs inside Bi-2212 single crystal  
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1st Author's Name Takashi Yoshida  
1st Author's Affiliation Nagaoka University of Technology (NUT)
2nd Author's Name Hiroaki Nawa  
2nd Author's Affiliation Nagaoka University of Technology (NUT)
3rd Author's Name Hayataka Tominaga  
3rd Author's Affiliation Nagaoka University of Technology (NUT)
4th Author's Name Atsushi Miwa  
4th Author's Affiliation Nagaoka University of Technology (NUT)
5th Author's Name Takahiro Kato  
5th Author's Affiliation Nagaoka University of Technology (NUT)
6th Author's Name Katsuyoshi Hamasaki  
6th Author's Affiliation Nagaoka University of Technology (NUT)
7th Author's Name Hisashi Shimakage  
7th Author's Affiliation National Institute of Information and Communications Technology (NICT)
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Speaker Author-1 
Date Time 2007-11-16 12:55:00 
Presentation Time 25 minutes 
Registration for CPM 
Paper # CPM2007-106 
Volume (vol) vol.107 
Number (no) no.325 
Page pp.7-11 
#Pages
Date of Issue 2007-11-09 (CPM) 


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