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Paper Abstract and Keywords
Presentation 2007-10-19 09:55
Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Relation to sliding contact mechanism --
Shin-ichi Wada, Taketo Sonoda, Hiroshi Amao, Yasuo Takahashi, Mitsuo Kikuchi, Hiroaki Kubota (TMC), Koichiro Sawa, Kei Koga (Keio Univ.) EMD2007-57 Link to ES Tech. Rep. Archives: EMD2007-57
Abstract (in Japanese) (See Japanese page) 
(in English) We developed the mechanism which gives vibration to electrical contacts by hammering and studied the influences of a micro-oscillating on these. Over 2.5 millions of hammering, the resistance of the contacts started increasing. Over 4 millions of hammering, the resistance often exceeded 200Ω. And over 7 millions of hammering, this fluctuated between 175Ω and 570Ω.
On the other hand, we also developed the mechanism which gives sliding to electrical contacts for comparison. This mechanism could detect the degradation phenomenon on these by influences of repeated sliding operations. Over 17 thousand of sliding, the resistance of the contacts started increasing, and after that the resistance fluctuated in between 20Ω and 250Ω. Although the two mechanisms are completely different( in methods, numbers, etc ), the results of two test were almost similar on the oscillational phenomenon.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / oscillating mechanism / micro-oscillation / contact resistance / sliding contact / sliding mechanism / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 272, EMD2007-57, pp. 7-12, Oct. 2007.
Paper # EMD2007-57 
Date of Issue 2007-10-12 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2007-57 Link to ES Tech. Rep. Archives: EMD2007-57

Conference Information
Committee EMD  
Conference Date 2007-10-19 - 2007-10-19 
Place (in Japanese) (See Japanese page) 
Place (in English) Keio Univ. Hiyoshi Campus 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Tribology, etc 
Paper Information
Registration To EMD 
Conference Code 2007-10-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation phenomenon of electrical contacts by hammering oscillating mechanism 
Sub Title (in English) Relation to sliding contact mechanism 
Keyword(1) electrical contact  
Keyword(2) oscillating mechanism  
Keyword(3) micro-oscillation  
Keyword(4) contact resistance  
Keyword(5) sliding contact  
Keyword(6) sliding mechanism  
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Keyword(8)  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co., Ltd. (TMC)
2nd Author's Name Taketo Sonoda  
2nd Author's Affiliation TMC System Co., Ltd. (TMC)
3rd Author's Name Hiroshi Amao  
3rd Author's Affiliation TMC System Co., Ltd. (TMC)
4th Author's Name Yasuo Takahashi  
4th Author's Affiliation TMC System Co., Ltd. (TMC)
5th Author's Name Mitsuo Kikuchi  
5th Author's Affiliation TMC System Co., Ltd. (TMC)
6th Author's Name Hiroaki Kubota  
6th Author's Affiliation TMC System Co., Ltd. (TMC)
7th Author's Name Koichiro Sawa  
7th Author's Affiliation Keio University (Keio Univ.)
8th Author's Name Kei Koga  
8th Author's Affiliation Keio University (Keio Univ.)
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Speaker Author-1 
Date Time 2007-10-19 09:55:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # EMD2007-57 
Volume (vol) vol.107 
Number (no) no.272 
Page pp.7-12 
#Pages
Date of Issue 2007-10-12 (EMD) 


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