IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2007-08-24 16:30
A 128-Kbit, 16-Port SRAM Design with Multi-Stage-Sensing Scheme in 90-nm CMOS Technology
Koh Johguchi, Yuya Mukuda, Shinya Izumi, Hans Juergen Mattausch, Tetsushi Koide (Hiroshima Univ.) SDM2007-169 ICD2007-97 Link to ES Tech. Rep. Archives: SDM2007-169 ICD2007-97
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
Keyword (in Japanese) (See Japanese page) 
(in English) / / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 195, ICD2007-97, pp. 149-154, Aug. 2007.
Paper # ICD2007-97 
Date of Issue 2007-08-16 (SDM, ICD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SDM2007-169 ICD2007-97 Link to ES Tech. Rep. Archives: SDM2007-169 ICD2007-97

Conference Information
Committee ICD SDM  
Conference Date 2007-08-23 - 2007-08-24 
Place (in Japanese) (See Japanese page) 
Place (in English) Kitami Institute of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English) VLSI Circuit and Device Technologies (High Speed, Low Voltage, and Low Power Consumption) 
Paper Information
Registration To ICD 
Conference Code 2007-08-ICD-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A 128-Kbit, 16-Port SRAM Design with Multi-Stage-Sensing Scheme in 90-nm CMOS Technology 
Sub Title (in English)  
Keyword(1)  
Keyword(2)  
Keyword(3)  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Koh Johguchi  
1st Author's Affiliation Hiroshima University (Hiroshima Univ.)
2nd Author's Name Yuya Mukuda  
2nd Author's Affiliation Hiroshima University (Hiroshima Univ.)
3rd Author's Name Shinya Izumi  
3rd Author's Affiliation Hiroshima University (Hiroshima Univ.)
4th Author's Name Hans Juergen Mattausch  
4th Author's Affiliation Hiroshima University (Hiroshima Univ.)
5th Author's Name Tetsushi Koide  
5th Author's Affiliation Hiroshima University (Hiroshima Univ.)
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker
Date Time 2007-08-24 16:30:00 
Presentation Time 25 
Registration for ICD 
Paper # IEICE-SDM2007-169,IEICE-ICD2007-97 
Volume (vol) IEICE-107 
Number (no) no.194(SDM), no.195(ICD) 
Page pp.149-154 
#Pages IEICE-6 
Date of Issue IEICE-SDM-2007-08-16,IEICE-ICD-2007-08-16 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan