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Paper Abstract and Keywords
Presentation 2007-08-24 08:55
Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variation in SoCs
Mitsuya Fukazawa, Tetsuro Matsuno, Toshifumi Uemura (Kobe Univ.), Rei Akiyama (Renesas Design), Tetsuya Kagemoto, Hiroshi Makino, Hidehiro Takata (Renesas Technology), Makoto Nagata (Kobe Univ.) SDM2007-156 ICD2007-84 Link to ES Tech. Rep. Archives: SDM2007-156 ICD2007-84
Abstract (in Japanese) (See Japanese page) 
(in English) Fine-grained built-in probing circuits are distributed at 120 locations on the SoC to allow continuous-time monitoring of power-supply variations. On-die high-pricision sampling circuits with 800uV/100ps resolution allow probing of 26 chip-wide locations of the CPU core including SRAM modules. Analog waveforms and peak-voltage measurements show confirmation of dynamic operation-mode transitions.
Keyword (in Japanese) (See Japanese page) 
(in English) Built-in proing circuit / Dynamic power supply noise / Power supply integrity / Operation-mode transition / Dynamic frequency scaling / / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 195, ICD2007-84, pp. 85-90, Aug. 2007.
Paper # ICD2007-84 
Date of Issue 2007-08-16 (SDM, ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SDM2007-156 ICD2007-84 Link to ES Tech. Rep. Archives: SDM2007-156 ICD2007-84

Conference Information
Committee ICD SDM  
Conference Date 2007-08-23 - 2007-08-24 
Place (in Japanese) (See Japanese page) 
Place (in English) Kitami Institute of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English) VLSI Circuit and Device Technologies (High Speed, Low Voltage, and Low Power Consumption) 
Paper Information
Registration To ICD 
Conference Code 2007-08-ICD-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variation in SoCs 
Sub Title (in English)  
Keyword(1) Built-in proing circuit  
Keyword(2) Dynamic power supply noise  
Keyword(3) Power supply integrity  
Keyword(4) Operation-mode transition  
Keyword(5) Dynamic frequency scaling  
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1st Author's Name Mitsuya Fukazawa  
1st Author's Affiliation Kobe University (Kobe Univ.)
2nd Author's Name Tetsuro Matsuno  
2nd Author's Affiliation Kobe University (Kobe Univ.)
3rd Author's Name Toshifumi Uemura  
3rd Author's Affiliation Kobe University (Kobe Univ.)
4th Author's Name Rei Akiyama  
4th Author's Affiliation Renesas Design (Renesas Design)
5th Author's Name Tetsuya Kagemoto  
5th Author's Affiliation Renesas Technology (Renesas Technology)
6th Author's Name Hiroshi Makino  
6th Author's Affiliation Renesas Technology (Renesas Technology)
7th Author's Name Hidehiro Takata  
7th Author's Affiliation Renesas Technology (Renesas Technology)
8th Author's Name Makoto Nagata  
8th Author's Affiliation Kobe University (Kobe Univ.)
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Speaker Author-1 
Date Time 2007-08-24 08:55:00 
Presentation Time 25 minutes 
Registration for ICD 
Paper # SDM2007-156, ICD2007-84 
Volume (vol) vol.107 
Number (no) no.194(SDM), no.195(ICD) 
Page pp.85-90 
#Pages
Date of Issue 2007-08-16 (SDM, ICD) 


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