Paper Abstract and Keywords |
Presentation |
2007-08-24 08:55
Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variation in SoCs Mitsuya Fukazawa, Tetsuro Matsuno, Toshifumi Uemura (Kobe Univ.), Rei Akiyama (Renesas Design), Tetsuya Kagemoto, Hiroshi Makino, Hidehiro Takata (Renesas Technology), Makoto Nagata (Kobe Univ.) SDM2007-156 ICD2007-84 Link to ES Tech. Rep. Archives: SDM2007-156 ICD2007-84 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Fine-grained built-in probing circuits are distributed at 120 locations on the SoC to allow continuous-time monitoring of power-supply variations. On-die high-pricision sampling circuits with 800uV/100ps resolution allow probing of 26 chip-wide locations of the CPU core including SRAM modules. Analog waveforms and peak-voltage measurements show confirmation of dynamic operation-mode transitions. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Built-in proing circuit / Dynamic power supply noise / Power supply integrity / Operation-mode transition / Dynamic frequency scaling / / / |
Reference Info. |
IEICE Tech. Rep., vol. 107, no. 195, ICD2007-84, pp. 85-90, Aug. 2007. |
Paper # |
ICD2007-84 |
Date of Issue |
2007-08-16 (SDM, ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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SDM2007-156 ICD2007-84 Link to ES Tech. Rep. Archives: SDM2007-156 ICD2007-84 |