Paper Abstract and Keywords |
Presentation |
2007-06-29 16:40
Investigation of Operation Tolerance of a Semiconductor Optical Digital-to-Analog Converter Kengo Sawada, Hiroyuki Uenohara (TITECH) OPE2007-28 LQE2007-29 Link to ES Tech. Rep. Archives: OPE2007-28 LQE2007-29 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
To realize an optical packet switch operating with high speed and low power consumption, we have investigated an optical digital-to-analog converter (ODAC) type label processor. It converts serial bits of label into a single pulse with multi-level amplitude. So multiple label signals can be recognized by one step process, and reduction of power consumption and the number of optical devices can be expected. Moreover, the integration of the ODAC on semiconductors is important for downsizing. We have reported 2-bit digital-to-analog conversion with a semiconductor integrated ODAC. However, output power fluctuation with phase difference, frequency chirping and extinction ratio are technical issues.
In this report, we estimate the influence of chirping in a semiconductor ODAC which causes output power fluctuation, and analyze the operation tolerance of phase, chirping, intensity, and extinction ratio of an ODAC by calculating the BER of output signal. The results indicate the operable conditions of label recognition with the semiconductor ODAC. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Optical Packet Switch / Optical digital-to-analog converter (ODAC) / Semiconductor integration / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 107, no. 124, OPE2007-28, pp. 65-70, June 2007. |
Paper # |
OPE2007-28 |
Date of Issue |
2007-06-22 (OPE, LQE) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
OPE2007-28 LQE2007-29 Link to ES Tech. Rep. Archives: OPE2007-28 LQE2007-29 |
Conference Information |
Committee |
LQE OPE |
Conference Date |
2007-06-29 - 2007-06-29 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
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Paper Information |
Registration To |
OPE |
Conference Code |
2007-06-LQE-OPE |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Investigation of Operation Tolerance of a Semiconductor Optical Digital-to-Analog Converter |
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Optical Packet Switch |
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Optical digital-to-analog converter (ODAC) |
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Semiconductor integration |
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1st Author's Name |
Kengo Sawada |
1st Author's Affiliation |
Tokyo Institute of Technology (TITECH) |
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Hiroyuki Uenohara |
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Tokyo Institute of Technology (TITECH) |
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Speaker |
Author-1 |
Date Time |
2007-06-29 16:40:00 |
Presentation Time |
25 minutes |
Registration for |
OPE |
Paper # |
OPE2007-28, LQE2007-29 |
Volume (vol) |
vol.107 |
Number (no) |
no.124(OPE), no.125(LQE) |
Page |
pp.65-70 |
#Pages |
6 |
Date of Issue |
2007-06-22 (OPE, LQE) |
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