| Paper Abstract and Keywords |
| Presentation |
2007-06-25 13:00
[Invited Talk]
Room-temperature-operating single-electron devices using silicon nanowire MOSFET
Katsuhiko Nishiguchi, Yukinori Ono, Akira Fujiwara (NTT), Hiroshi Inokawa (Shizuoka Univ.), Yasuo Takahashi (Hokkaido Univ.) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
In this paper, we report the development of devices for single-electron transfer and detection at room temperature, using silicon metal-oxide-semiconductor field-effect transistors (MOSFETs). Single electrons are transferred to a storage node (SN) by modulating the potential barrier in the channel of the MOSFETs. Another MOSFET, located close to the SN, detects electrons transferred into the SN with single-electron resolution. These transfer and detection functions were applied to a digital-to-analog converter, gain-cell memory, and infrared sensor. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
silicon / single-electron device / MOSFET / single-electron transfer / single-electron detection / data information circuit / sensor / |
| Reference Info. |
IEICE Tech. Rep. |
| Paper # |
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| Download PDF |
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| Conference Information |
| Committee |
ED SDM |
| Conference Date |
2007-06-25 - 2007-06-27 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Commodore Hotel Gyeongju Chosun, Gyeongju, Korea |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
2007 Asia-Pacific Workshopn on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD2007) |
| Paper Information |
| Registration To |
SDM |
| Conference Code |
2007-06-ED-SDM |
| Language |
English (Japanese title is available) |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Room-temperature-operating single-electron devices using silicon nanowire MOSFET |
| Sub Title (in English) |
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| Keyword(1) |
silicon |
| Keyword(2) |
single-electron device |
| Keyword(3) |
MOSFET |
| Keyword(4) |
single-electron transfer |
| Keyword(5) |
single-electron detection |
| Keyword(6) |
data information circuit |
| Keyword(7) |
sensor |
| Keyword(8) |
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| 1st Author's Name |
Katsuhiko Nishiguchi |
| 1st Author's Affiliation |
NTT Basic Research Laboratories (NTT) |
| 2nd Author's Name |
Yukinori Ono |
| 2nd Author's Affiliation |
NTT Basic Research Laboratories (NTT) |
| 3rd Author's Name |
Akira Fujiwara |
| 3rd Author's Affiliation |
NTT Basic Research Laboratories (NTT) |
| 4th Author's Name |
Hiroshi Inokawa |
| 4th Author's Affiliation |
Shizuoka University (Shizuoka Univ.) |
| 5th Author's Name |
Yasuo Takahashi |
| 5th Author's Affiliation |
Hokkaido University (Hokkaido Univ.) |
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| Speaker |
Author-1 |
| Date Time |
2007-06-25 13:00:00 |
| Presentation Time |
minutes |
| Registration for |
SDM |
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