Paper Abstract and Keywords |
Presentation |
2007-06-14 14:45
A randomness test on a quantum crypto-key Akihiro Tanaka, Wakako Maeda, Seigo Takahashi, Akio Tajima (NEC) OCS2007-13 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We have established key techniques to ensure the randomness of crypto-key shared using Quantum Key Distribution. We have succeeded in the suppression of a mark ratio fluctuation caused by the deterioration of the equipment operating condition, by monitoring the mark ratio and changing bias voltage given to photon detectors. We confirmed that local polarization of 0s and 1s caused by afterpulse effect of photon detectors should be reduced in order to pass the randomness test. Crossing output port of interferometer with respect to each basis and monitoring the mark ratio at Alice, we have confirmed shared key pass the randomness test at each stage from sifted to final key. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Quantum Key Distribution / Randomness Test / / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 107, no. 89, OCS2007-13, pp. 19-24, June 2007. |
Paper # |
OCS2007-13 |
Date of Issue |
2007-06-07 (OCS) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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OCS2007-13 |
Conference Information |
Committee |
OCS PN CS |
Conference Date |
2007-06-14 - 2007-06-15 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Chitose Inst. of Science and Technology |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Photonic network, network control, optical switching, wavelength conversion, optical quantum communications, GMPLS, etc. |
Paper Information |
Registration To |
OCS |
Conference Code |
2007-06-OCS-PN-CS |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
A randomness test on a quantum crypto-key |
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Quantum Key Distribution |
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Randomness Test |
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1st Author's Name |
Akihiro Tanaka |
1st Author's Affiliation |
NEC Corporation (NEC) |
2nd Author's Name |
Wakako Maeda |
2nd Author's Affiliation |
NEC Corporation (NEC) |
3rd Author's Name |
Seigo Takahashi |
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NEC Corporation (NEC) |
4th Author's Name |
Akio Tajima |
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NEC Corporation (NEC) |
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Speaker |
Author-1 |
Date Time |
2007-06-14 14:45:00 |
Presentation Time |
25 minutes |
Registration for |
OCS |
Paper # |
OCS2007-13 |
Volume (vol) |
vol.107 |
Number (no) |
no.89 |
Page |
pp.19-24 |
#Pages |
6 |
Date of Issue |
2007-06-07 (OCS) |
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