Paper Abstract and Keywords |
Presentation |
2007-03-09 14:00
Study of Return Loss for a Test Board with Bonding Wires by FDTD Method Hsing-Yi Chen, Chieh-Pin Su (Yuan Ze Univ.) AP2006-166 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Return losses of bonding wires fabricated on a test board for RF and microwave circuit applications are studied by the finite-difference time-domain (FDTD) method. Simulation results of return losses obtained by the FDTD method are presented and compared with those obtained by the HFSS software and measurements at frequencies of 0.04~6 GHz. It is found that simulation results calculated by the FDTD method make a good agreement with those obtained by the HFSS software. Results of the FDTD method are also further validated by the measurement data. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Return losses / bonding wires / FDTD / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 106, no. 561, AP2006-166, pp. 97-100, March 2007. |
Paper # |
AP2006-166 |
Date of Issue |
2007-03-01 (AP) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
AP2006-166 |
Conference Information |
Committee |
AP |
Conference Date |
2007-03-08 - 2007-03-09 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Taiwan (Yuan Ze Univ.) |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Antennas and Propagation |
Paper Information |
Registration To |
AP |
Conference Code |
2007-03-AP |
Language |
English |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Study of Return Loss for a Test Board with Bonding Wires by FDTD Method |
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Return losses |
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bonding wires |
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FDTD |
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1st Author's Name |
Hsing-Yi Chen |
1st Author's Affiliation |
Yuan Ze University (Yuan Ze Univ.) |
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Chieh-Pin Su |
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Yuan Ze University (Yuan Ze Univ.) |
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Speaker |
Author-1 |
Date Time |
2007-03-09 14:00:00 |
Presentation Time |
20 minutes |
Registration for |
AP |
Paper # |
AP2006-166 |
Volume (vol) |
vol.106 |
Number (no) |
no.561 |
Page |
pp.97-100 |
#Pages |
4 |
Date of Issue |
2007-03-01 (AP) |