| Paper Abstract and Keywords |
| Presentation |
2006-11-28 16:35
A Self-Test of Dynamically Reconfigurable Processors
Takashi Fujii, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
Dynamically Reconfigurable Processor (DRP), which can execute a task with multiple hardware contexts so as to achieve high area-efficiency, needs a new test methodology because of its distinctive architecture. In this paper, we propose a a self-test method of DRPs without area overhead. This method constructs a test flame of processor elements (PEs) such that it consists of test pattern generators, response analyzers and PEs under test, and switches several test flames dynamically so as to test all the PEs. Since the structure of a test flame decides the number of contexts and test application time, we design some test flames with different structures and discuss the relationship of the structures to the number of contexts and test application time. Based on this discussion, we can construct the best test flame according to a given test environment. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
Dynamically reconfigurable processors / self-test / number of contexts / test application time / test-frames / / / |
| Reference Info. |
IEICE Tech. Rep., vol. 106, no. 390, DC2006-49, pp. 65-70, Nov. 2006. |
| Paper # |
DC2006-49 |
| Date of Issue |
2006-11-21 (VLD, DC) |
| ISSN |
Print edition: ISSN 0913-5685 |
| Download PDF |
|
| Conference Information |
| Committee |
RECONF CPSY VLD DC IPSJ-SLDM IPSJ-ARC |
| Conference Date |
2006-11-28 - 2006-11-30 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Kitakyushu International Conference Center |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
Design Gaia 2006 ---A New Frontier in VLSI Design--- |
| Paper Information |
| Registration To |
DC |
| Conference Code |
2006-11-RECONF-CPSY-VLD-DC-IPSJ-SLDM-IPSJ-ARC |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
A Self-Test of Dynamically Reconfigurable Processors |
| Sub Title (in English) |
|
| Keyword(1) |
Dynamically reconfigurable processors |
| Keyword(2) |
self-test |
| Keyword(3) |
number of contexts |
| Keyword(4) |
test application time |
| Keyword(5) |
test-frames |
| Keyword(6) |
|
| Keyword(7) |
|
| Keyword(8) |
|
| 1st Author's Name |
Takashi Fujii |
| 1st Author's Affiliation |
Hiroshima City University (Hiroshima City Univ.) |
| 2nd Author's Name |
Hideyuki Ichihara |
| 2nd Author's Affiliation |
Hiroshima City University (Hiroshima City Univ.) |
| 3rd Author's Name |
Tomoo Inoue |
| 3rd Author's Affiliation |
Hiroshima City University (Hiroshima City Univ.) |
| 4th Author's Name |
|
| 4th Author's Affiliation |
() |
| 5th Author's Name |
|
| 5th Author's Affiliation |
() |
| 6th Author's Name |
|
| 6th Author's Affiliation |
() |
| 7th Author's Name |
|
| 7th Author's Affiliation |
() |
| 8th Author's Name |
|
| 8th Author's Affiliation |
() |
| 9th Author's Name |
|
| 9th Author's Affiliation |
() |
| 10th Author's Name |
|
| 10th Author's Affiliation |
() |
| 11th Author's Name |
|
| 11th Author's Affiliation |
() |
| 12th Author's Name |
|
| 12th Author's Affiliation |
() |
| 13th Author's Name |
|
| 13th Author's Affiliation |
() |
| 14th Author's Name |
|
| 14th Author's Affiliation |
() |
| 15th Author's Name |
|
| 15th Author's Affiliation |
() |
| 16th Author's Name |
|
| 16th Author's Affiliation |
() |
| 17th Author's Name |
|
| 17th Author's Affiliation |
() |
| 18th Author's Name |
|
| 18th Author's Affiliation |
() |
| 19th Author's Name |
|
| 19th Author's Affiliation |
() |
| 20th Author's Name |
|
| 20th Author's Affiliation |
() |
| Speaker |
Author-1 |
| Date Time |
2006-11-28 16:35:00 |
| Presentation Time |
25 minutes |
| Registration for |
DC |
| Paper # |
VLD2006-62, DC2006-49 |
| Volume (vol) |
vol.106 |
| Number (no) |
no.387(VLD), no.390(DC) |
| Page |
pp.65-70 |
| #Pages |
6 |
| Date of Issue |
2006-11-21 (VLD, DC) |
|