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| Presentation | 2006-10-26 09:40 12GHz Measurement of voltage and current rise time due to micro gap discharge. Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi, Akira Haga (Tohoku Gakuin Univ.), Osamu Fujiwara (Nagoya Inst. of Tech.)  EMCJ2006-51 MW2006-107 Link to ES Tech. Rep. Archives: MW2006-107 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | The voltage and current rise time due to small gap discharge as the low voltage ESD was investigated in time domain. The measurement system was improved on the band width from 6GHz to 12GHz using the coaxial electrode system. Also, the sensing system was changed from the coupled transmission lines to an E-field sensor and a H-field sensor. The insertion loss of the experimental system was within about -3dB in frequency range below 12GHz. It was confirmed that the distributed constant experimental system with coaxial electrode enables to measure the very fast transition duration of about 40 ps in 12GHz bandwidth. As a consequence of the experiment using the system, voltage and current rise time of transition duration were shown 35 ps or less. Besides, the rise times were changed in configuration of electrodes, source polarity and discharging voltage. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | ESD / contact / discharge / rise time / time domain / distributed constant line / / | |
| Reference Info. | IEICE Tech. Rep., vol. 106, no. 322, EMCJ2006-51, pp. 1-5, Oct. 2006. | |
| Paper # | EMCJ2006-51 | |
| Date of Issue | 2006-10-19 (EMCJ, MW) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EMCJ2006-51 MW2006-107 Link to ES Tech. Rep. Archives: MW2006-107 |
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| Conference Information | |
| Committee | EMCJ MW |
| Conference Date | 2006-10-26 - 2006-10-27 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Hachinohe Institute of Technology |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | EMCJ |
| Conference Code | 2006-10-EMCJ-MW |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | 12GHz Measurement of voltage and current rise time due to micro gap discharge. |
| Sub Title (in English) | |
| Keyword(1) | ESD |
| Keyword(2) | contact |
| Keyword(3) | discharge |
| Keyword(4) | rise time |
| Keyword(5) | time domain |
| Keyword(6) | distributed constant line |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Ken Kawamata |
| 1st Author's Affiliation | Hachinohe Institute of Technology (Hachinohe Inst. of Tech.) |
| 2nd Author's Name | Shigeki Minegishi |
| 2nd Author's Affiliation | Tohoku Gakuin University (Tohoku Gakuin Univ.) |
| 3rd Author's Name | Akira Haga |
| 3rd Author's Affiliation | Tohoku Gakuin University (Tohoku Gakuin Univ.) |
| 4th Author's Name | Osamu Fujiwara |
| 4th Author's Affiliation | Nagoya Institute of Technology (Nagoya Inst. of Tech.) |
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| Speaker | Author-1 |
| Date Time | 2006-10-26 09:40:00 |
| Presentation Time | 25 minutes |
| Registration for | EMCJ |
| Paper # | EMCJ2006-51, MW2006-107 |
| Volume (vol) | vol.106 |
| Number (no) | no.322(EMCJ), no.323(MW) |
| Page | pp.1-5 |
| #Pages | 5 |
| Date of Issue | 2006-10-19 (EMCJ, MW) |
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