Paper Abstract and Keywords |
Presentation |
2006-07-28 12:00
High frequency magnetic imaging with a high sensitivity integrated magnetic probe Satoshi Aoyama, Shoji Kawahito (Shizuoka Univ.), Masahiro Yamaguchi (Tohoku Univ.) Link to ES Tech. Rep. Archives: ICD2006-72 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
A novel magnetic probe has been designed and fabricated in a 0.15 $\mu m$ five-metal CMOS-SOI technology, in order to achieve both high sensitivity and high spatial resolution.
A detecting coil, a 2-stage differential amplifier, a differential to single-ended converter, an output buffer and other peripheral circuits are all integrated on a single chip. The probe has a feature to distinguish magnetic field from the detected electromagnetic emissions, by means of a 2-turn differential coil structure and a circuit technique of a wideband differential-to-single-ended converter with the high common mode rejection.
A 2D magnetic distribution map has been drawn by the fabricated active probe, and the obtained image is finer than that of a shielded loop coil. Furthermore, the concurrent measurement of the magnetic field with three aligned minute active probes has been demonstrated using electrical switching. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Magnetic Probe / Active Probe / Array / Near Field Measurement / CMOS-SOI / EMC / EMI / |
Reference Info. |
IEICE Tech. Rep., vol. 106, no. 189, ICD2006-72, pp. 67-72, July 2006. |
Paper # |
ICD2006-72 |
Date of Issue |
2006-07-20 (ICD) |
ISSN |
Print edition: ISSN 0913-5685 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
Link to ES Tech. Rep. Archives: ICD2006-72 |
Conference Information |
Committee |
ICD ITE-IST |
Conference Date |
2006-07-27 - 2006-07-28 |
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(See Japanese page) |
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Paper Information |
Registration To |
ICD |
Conference Code |
2006-07-ICD-ITE-IST |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
High frequency magnetic imaging with a high sensitivity integrated magnetic probe |
Sub Title (in English) |
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Keyword(1) |
Magnetic Probe |
Keyword(2) |
Active Probe |
Keyword(3) |
Array |
Keyword(4) |
Near Field Measurement |
Keyword(5) |
CMOS-SOI |
Keyword(6) |
EMC |
Keyword(7) |
EMI |
Keyword(8) |
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1st Author's Name |
Satoshi Aoyama |
1st Author's Affiliation |
Shizuoka University (Shizuoka Univ.) |
2nd Author's Name |
Shoji Kawahito |
2nd Author's Affiliation |
Shizuoka University (Shizuoka Univ.) |
3rd Author's Name |
Masahiro Yamaguchi |
3rd Author's Affiliation |
Tohoku University (Tohoku Univ.) |
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Speaker |
Author-1 |
Date Time |
2006-07-28 12:00:00 |
Presentation Time |
30 minutes |
Registration for |
ICD |
Paper # |
ICD2006-72 |
Volume (vol) |
vol.106 |
Number (no) |
no.189 |
Page |
pp.67-72 |
#Pages |
6 |
Date of Issue |
2006-07-20 (ICD) |
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