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Paper Abstract and Keywords
Presentation 2006-06-21 14:55
Characterization of open volumes in high-k gate dielectrics by using monoenergetic positron beams
Akira Uedono, T. Otsuka, K. Ito, K. Shiraishi, Kikuo Yamabe (Univ. of Tsukuba), Seiichi Miyazaki (Hiroshima Univ.), Naoto Umezawa, Toyohiro Chikyow (NIMS), Toshiyuki Ohdaira, R. Suzuki (AIST), Seiji Inumiya, Satoshi Kamiyama (Selete), Yasushi Akasaka (TEL), Yasuo Nara (Selete), Keisaku Yamada (Waseda Uni.) Link to ES Tech. Rep. Archives: SDM2006-46
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
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Reference Info. IEICE Tech. Rep., vol. 106, no. 108, SDM2006-46, pp. 25-30, June 2006.
Paper # SDM2006-46 
Date of Issue 2006-06-14 (SDM) 
ISSN Print edition: ISSN 0913-5685
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee SDM  
Conference Date 2006-06-21 - 2006-06-22 
Place (in Japanese) (See Japanese page) 
Place (in English) Faculty Club, Hiroshima Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Science and Technologies of Dielectric Thin Films for Future Electron Devices 
Paper Information
Registration To SDM 
Conference Code 2006-06-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Characterization of open volumes in high-k gate dielectrics by using monoenergetic positron beams 
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1st Author's Name Akira Uedono  
1st Author's Affiliation University of Tsukuba (Univ. of Tsukuba)
2nd Author's Name T. Otsuka  
2nd Author's Affiliation University of Tsukuba (Univ. of Tsukuba)
3rd Author's Name K. Ito  
3rd Author's Affiliation University of Tsukuba (Univ. of Tsukuba)
4th Author's Name K. Shiraishi  
4th Author's Affiliation University of Tsukuba (Univ. of Tsukuba)
5th Author's Name Kikuo Yamabe  
5th Author's Affiliation University of Tsukuba (Univ. of Tsukuba)
6th Author's Name Seiichi Miyazaki  
6th Author's Affiliation Hiroshima University (Hiroshima Univ.)
7th Author's Name Naoto Umezawa  
7th Author's Affiliation NIMS (NIMS)
8th Author's Name Toyohiro Chikyow  
8th Author's Affiliation NIMS (NIMS)
9th Author's Name Toshiyuki Ohdaira  
9th Author's Affiliation AIST (AIST)
10th Author's Name R. Suzuki  
10th Author's Affiliation AIST (AIST)
11th Author's Name Seiji Inumiya  
11th Author's Affiliation Selete (Selete)
12th Author's Name Satoshi Kamiyama  
12th Author's Affiliation Selete (Selete)
13th Author's Name Yasushi Akasaka  
13th Author's Affiliation Tokyo Electron Limited (TEL)
14th Author's Name Yasuo Nara  
14th Author's Affiliation Selete (Selete)
15th Author's Name Keisaku Yamada  
15th Author's Affiliation Waseda University (Waseda Uni.)
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Speaker Author-1 
Date Time 2006-06-21 14:55:00 
Presentation Time 25 minutes 
Registration for SDM 
Paper # SDM2006-46 
Volume (vol) vol.106 
Number (no) no.108 
Page pp.25-30 
#Pages
Date of Issue 2006-06-14 (SDM) 


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